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Fingerprint Dive into the research topics where Hiroshi Nakashima is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

Engineering & Materials Science

Electron cyclotron resonance
Silicon
Deep level transient spectroscopy
Plasmas
Sputtering
Annealing
Fabrication
Defects
Temperature
Photoluminescence
Passivation
Metals
Substrates
Electric properties
MOSFET devices
Interface states
Oxides
Gate dielectrics
Diodes
Ions
Cobalt
Thin films
Boron
Oxidation
Energy gap
Capacitance
Electroluminescence
Iron
Electrons
Condensation
Germanium
Impurities
Etching
Atoms
Oxide films
Transmission electron microscopy
Microwaves
Light emission
Hole mobility
Strain relaxation
Solubility
Ion bombardment
Epilayers
Flow rate
Membranes
Leakage currents
Structural properties
Epitaxial growth
Valence bands
Crystallization

Physics & Astronomy

Physics

electron cyclotron resonance
photoluminescence
electroluminescence
temperature
diffusion coefficient
room temperature
ions
flow velocity

Chemistry and Materials

silicon
oxides
germanium
iron
oxidation
boron
cobalt
crystallization
vanadium
silicon oxides

Engineering

annealing
metal oxide semiconductors
electrical properties
sputtering
field effect transistors
fabrication
traps
interlayers
capacitance
hole mobility
etching
solar cells
transistors
conduction bands
Hall effect

General

insulators
passivity
defects
wafers
evaluation
thin films
metals
oxide films
capacitors
impurities
interstitials
transmission electron microscopy
membranes
condensation
microwaves

Aerospace Sciences

spectroscopy
photoelectron spectroscopy

Chemical Compounds

Electron cyclotron resonance
Plasmas
Silicon
Sputtering
Annealing
Oxides
Deep level transient spectroscopy
Photoluminescence
Gate dielectrics
Substrates
Electric properties
Defects
Fabrication
MOSFET devices
Temperature
Metals
Germanium
Microwaves
Thin films
Iron
Interface states
Passivation
Boron
Crystallization
Transmission electron microscopy
Oxidation
Hall effect
Aluminum
Energy gap
Membranes
Nitrogen
Hole mobility
Impurities
Oxide films
Strain relaxation
X ray photoelectron spectroscopy
Electroluminescence
Condensation
Absorption spectroscopy
Flow rate
Atoms
Electron traps
Sputter deposition
Structural properties
Polysilicon
Personal digital assistants
Diodes
Carbon Nanotubes
Contamination
Electron diffraction