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Fingerprint Dive into the research topics where Inoue Koji is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

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Data storage equipment Engineering & Materials Science
Particle accelerators Engineering & Materials Science
Microprocessor chips Engineering & Materials Science
Data flow graphs Engineering & Materials Science
Dynamic random access storage Engineering & Materials Science
Electric power utilization Engineering & Materials Science
Hardware Engineering & Materials Science
Networks (circuits) Engineering & Materials Science

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Research Output 1998 2019

29.3 A 48GHz 5.6mW Gate-Level-Pipelined Multiplier Using Single-Flux Quantum Logic

Nagaoka, I., Tanaka, M., Koji, I. & Fujimaki, A., Mar 6 2019, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., p. 460-462 3 p. 8662351. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2019-February).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fluxes
Superconducting materials
Clocks
Electric power utilization
Throughput
Critical path analysis
Critical Path
Path Analysis
Cycle
Statistical methods

Hardware friendly algorithm for earthquakes discrimination based on wavelet filter bank and support vector machine

Saad, O. M., Shalaby, A., Koji, I. & Sayed, M. S., Apr 1 2019, 2018 Proceedings of the Japan-Africa Conference on Electronics, Communications, and Computations, JAC-ECC 2018. Institute of Electrical and Electronics Engineers Inc., p. 115-118 4 p. 8679531. (2018 Proceedings of the Japan-Africa Conference on Electronics, Communications, and Computations, JAC-ECC 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Filter banks
Support vector machines
Field programmable gate arrays (FPGA)
Earthquakes
Classifiers

Improving lifetime in MLC phase change memory using slow writes

Ono, T., Chen, Z. & Koji, I., Apr 1 2019, 2018 Proceedings of the Japan-Africa Conference on Electronics, Communications, and Computations, JAC-ECC 2018. Institute of Electrical and Electronics Engineers Inc., p. 65-68 4 p. 8679540. (2018 Proceedings of the Japan-Africa Conference on Electronics, Communications, and Computations, JAC-ECC 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Phase change memory
Durability
Degradation