Research Output per year
Research Output per year
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Dive into the research topics where Keisuke Yamamoto is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Research Output
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Border-trap characterization for Ge gate stacks with Thin GeOx layer using deep-level transient spectroscopy
Nakashima, H., Wen, W. C., Yamamoto, K. & Wang, D., 2020, PRiME 2020: SiGe, Ge, and Related Compounds: Materials, Processing, and Devices 9. Liu, Q., Hartmann, J. M., Holt, J. R., Gong, X., Jain, V., Niu, G., Masini, G., Ogura, A., Miyazaki, S., Ostling, M., Bi, W., Schulze, A. & Mai, A. (eds.). 5 ed. IOP Publishing Ltd., p. 395-404 10 p. 395. (ECS Transactions; vol. 98, no. 5).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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High interfacial quality metal-oxide-semiconductor capacitor on (111) oriented 3C-SiC with Al2O3 interlayer and its internal charge analysis
Oka, R., Yamamoto, K., Akamine, H., Wang, D., Nakashima, H., Hishiki, S. & Kawamura, K., Apr 1 2020, In : Japanese journal of applied physics. 59, SG, SGGD17.Research output: Contribution to journal › Article › peer-review
1 Citation (Scopus) -
Interface trap and border trap characterization for Al2O3/GeOx/Ge gate stacks and influence of these traps on mobility of Ge p-MOSFET
Wen, W. C., Nagatomi, Y., Akamine, H., Yamamoto, K., Wang, D. & Nakashima, H., Jun 1 2020, In : AIP Advances. 10, 6, 065119.Research output: Contribution to journal › Article › peer-review
Open Access -
Isothermal Growth and Stacking Evolution in Highly Uniform Bernal-Stacked Bilayer Graphene
Solís-Fernández, P., Terao, Y., Kawahara, K., Nishiyama, W., Uwanno, T., Lin, Y. C., Yamamoto, K., Nakashima, H., Nakashima, H., Nagashio, K., Hibino, H., Suenaga, K., Ago, H. & Ago, H., Jun 23 2020, In : ACS nano. 14, 6, p. 6834-6844 11 p.Research output: Contribution to journal › Article › peer-review
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The Benefits of Using SiN as a Buried Oxide in Germanium-On-Insulator Substrate
Duangchan, S., Yamamoto, K., Wang, D., Nakashima, H. & Baba, A., Apr 2020, 4th Electron Devices Technology and Manufacturing Conference, EDTM 2020 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 9117986. (4th Electron Devices Technology and Manufacturing Conference, EDTM 2020 - Proceedings).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution