金属疲労 S-N 曲線の基本構造と疲労寿命のばらつきの本質

Translated title of the contribution: Essential Structure of S-N Curve and the Essence of Scatter of Fatigue Life

Yukitaka Murakami, Toshio Takagi, Kentaro Wada, Yoshihiro Fukushima, Hisao Matsunaga

Research output: Contribution to journalArticlepeer-review

Abstract

Historically, S-N curve has been expressed in the form of an exponential relationship between applied stress σ and number of cycles to failure Nf regardless of scatter of data. This paper elucidates the essential structure of S-N curve and the causes of scatter of fatigue life and fatigue limit based on the prediction model for materials containing various defects. The validity of the model was verified by testing specimens containing small defects with various sizes and by analyzing the difference of failure lives due to defect size. The model was successfully applied to the data reported by other researchers. It was revealed that the statistical nature of the scatter of fatigue data should be expressed by the statistics of extremes, because the source of the scatter is originated from the largest defect contained in specimens.

Translated title of the contributionEssential Structure of S-N Curve and the Essence of Scatter of Fatigue Life
Original languageJapanese
Pages (from-to)881-888
Number of pages8
JournalClinical Neurology
Volume70
Issue number12
DOIs
Publication statusPublished - 2021

All Science Journal Classification (ASJC) codes

  • Clinical Neurology

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