10 to 72-Gb/s, optoelectronic RZ pulse-pattern generation and its application to on-wafer large-signal characterization for ultrahigh-speed electronic devices

Taiichi Otsuji, Kazutoshi Kato, Tadao Nagatsuma, Mikio Yoneyama

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

A pulse-rate tunable, fully electrically controllable optoelectronic random pulse generator operating at 10 to 72 Gb/s in return-to-zero (RZ) mode and an on-wafer optical-to-electrical conversion stimulus probe head with 0.6-A/W responsivity, 200-mVpp saturation output, and a near 100-GHz bandwidth is addressed. Its application, in combination with electrooptic sampling (EOS), to characterizing an ultrawide band amplifier is also demonstrated.

Original languageEnglish
Title of host publicationIEEE LEOS Annual Meeting - Proceedings
PublisherIEEE
Pages203-204
Number of pages2
Volume2
Publication statusPublished - 1994
Externally publishedYes
EventProceedings of the 1994 IEEE LEOS Annual Meeting. Part 1 (of 2) - Boston, MA, USA
Duration: Oct 31 1994Nov 3 1994

Other

OtherProceedings of the 1994 IEEE LEOS Annual Meeting. Part 1 (of 2)
CityBoston, MA, USA
Period10/31/9411/3/94

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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