2D potential measurements by applying automatic beam adjustment system to heavy ion beam probe diagnostic on the Large Helical Device

A. Shimizu, T. Ido, M. Kurachi, R. Makino, M. Nishiura, S. Kato, A. Nishizawa, Y. Hamada

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Two-dimensional potential profiles in the Large Helical Device (LHD) were measured with heavy ion beam probe (HIBP). To measure the two-dimensional profile, the probe beam energy has to be changed. However, this task is not easy, because the beam transport line of LHD-HIBP system is very long (∼20 m), and the required beam adjustment consumes much time. To reduce the probe beam energy adjustment time, an automatic beam adjustment system has been developed. Using this system, required time to change the probe beam energy is dramatically reduced, such that two-dimensional potential profiles were able to be successfully measured with HIBP by changing the probe beam energy shot to shot.

Original languageEnglish
Article number11D853
JournalReview of Scientific Instruments
Volume85
Issue number11
DOIs
Publication statusPublished - Nov 2014

All Science Journal Classification (ASJC) codes

  • Instrumentation

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