2D spatial profile measurements of potential fluctuation with heavy ion beam probe on the Large Helical Device

A. Shimizu, T. Ido, M. Nishiura, S. Kato, K. Ogawa, H. Takahashi, H. Igami, Y. Yoshimura, S. Kubo, T. Shimozuma

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Two-dimensional spatial profiles of potential fluctuation were measured with the heavy ion beam probe (HIBP) in the Large Helical Device (LHD). For 2D spatial profile measurements, the probe beam energy has to be changed, which requires the adjustment of many deflectors in the beam transport line to optimize the beam trajectory, since the transport line of LHD-HIBP system is long. The automatic beam adjustment system was developed, which allows us to adjust the beam trajectory easily. By analyzing coherence between potential fluctuation and magnetic probe signal, the noise level of the mode power spectrum of the potential fluctuation can be reduced. By using this method, the 2D spatial profile of potential fluctuation profile was successfully obtained.

Original languageEnglish
Article number11E731
JournalReview of Scientific Instruments
Volume87
Issue number11
DOIs
Publication statusPublished - Nov 1 2016
Externally publishedYes

Fingerprint

Heavy ions
Ion beams
heavy ions
ion beams
probes
profiles
Trajectories
adjusting
trajectories
magnetic probes
Power spectrum
deflectors
power spectra
energy

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

2D spatial profile measurements of potential fluctuation with heavy ion beam probe on the Large Helical Device. / Shimizu, A.; Ido, T.; Nishiura, M.; Kato, S.; Ogawa, K.; Takahashi, H.; Igami, H.; Yoshimura, Y.; Kubo, S.; Shimozuma, T.

In: Review of Scientific Instruments, Vol. 87, No. 11, 11E731, 01.11.2016.

Research output: Contribution to journalArticle

Shimizu, A, Ido, T, Nishiura, M, Kato, S, Ogawa, K, Takahashi, H, Igami, H, Yoshimura, Y, Kubo, S & Shimozuma, T 2016, '2D spatial profile measurements of potential fluctuation with heavy ion beam probe on the Large Helical Device', Review of Scientific Instruments, vol. 87, no. 11, 11E731. https://doi.org/10.1063/1.4963908
Shimizu, A. ; Ido, T. ; Nishiura, M. ; Kato, S. ; Ogawa, K. ; Takahashi, H. ; Igami, H. ; Yoshimura, Y. ; Kubo, S. ; Shimozuma, T. / 2D spatial profile measurements of potential fluctuation with heavy ion beam probe on the Large Helical Device. In: Review of Scientific Instruments. 2016 ; Vol. 87, No. 11.
@article{702b493c731444fd83163bf26637118c,
title = "2D spatial profile measurements of potential fluctuation with heavy ion beam probe on the Large Helical Device",
abstract = "Two-dimensional spatial profiles of potential fluctuation were measured with the heavy ion beam probe (HIBP) in the Large Helical Device (LHD). For 2D spatial profile measurements, the probe beam energy has to be changed, which requires the adjustment of many deflectors in the beam transport line to optimize the beam trajectory, since the transport line of LHD-HIBP system is long. The automatic beam adjustment system was developed, which allows us to adjust the beam trajectory easily. By analyzing coherence between potential fluctuation and magnetic probe signal, the noise level of the mode power spectrum of the potential fluctuation can be reduced. By using this method, the 2D spatial profile of potential fluctuation profile was successfully obtained.",
author = "A. Shimizu and T. Ido and M. Nishiura and S. Kato and K. Ogawa and H. Takahashi and H. Igami and Y. Yoshimura and S. Kubo and T. Shimozuma",
year = "2016",
month = "11",
day = "1",
doi = "10.1063/1.4963908",
language = "English",
volume = "87",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "11",

}

TY - JOUR

T1 - 2D spatial profile measurements of potential fluctuation with heavy ion beam probe on the Large Helical Device

AU - Shimizu, A.

AU - Ido, T.

AU - Nishiura, M.

AU - Kato, S.

AU - Ogawa, K.

AU - Takahashi, H.

AU - Igami, H.

AU - Yoshimura, Y.

AU - Kubo, S.

AU - Shimozuma, T.

PY - 2016/11/1

Y1 - 2016/11/1

N2 - Two-dimensional spatial profiles of potential fluctuation were measured with the heavy ion beam probe (HIBP) in the Large Helical Device (LHD). For 2D spatial profile measurements, the probe beam energy has to be changed, which requires the adjustment of many deflectors in the beam transport line to optimize the beam trajectory, since the transport line of LHD-HIBP system is long. The automatic beam adjustment system was developed, which allows us to adjust the beam trajectory easily. By analyzing coherence between potential fluctuation and magnetic probe signal, the noise level of the mode power spectrum of the potential fluctuation can be reduced. By using this method, the 2D spatial profile of potential fluctuation profile was successfully obtained.

AB - Two-dimensional spatial profiles of potential fluctuation were measured with the heavy ion beam probe (HIBP) in the Large Helical Device (LHD). For 2D spatial profile measurements, the probe beam energy has to be changed, which requires the adjustment of many deflectors in the beam transport line to optimize the beam trajectory, since the transport line of LHD-HIBP system is long. The automatic beam adjustment system was developed, which allows us to adjust the beam trajectory easily. By analyzing coherence between potential fluctuation and magnetic probe signal, the noise level of the mode power spectrum of the potential fluctuation can be reduced. By using this method, the 2D spatial profile of potential fluctuation profile was successfully obtained.

UR - http://www.scopus.com/inward/record.url?scp=84992207032&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84992207032&partnerID=8YFLogxK

U2 - 10.1063/1.4963908

DO - 10.1063/1.4963908

M3 - Article

AN - SCOPUS:84992207032

VL - 87

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 11

M1 - 11E731

ER -