40t soft X-ray spectroscopies on magnetic-field-induced valence transition in Eu(Rh1-xIrx)2Si2 (x = 0.3)

Hiromasa Yasumura, Yasuo Narumi, Tetsuya Nakamura, Yoshinori Kotani, Akira Yasui, Eigo Kishaba, Akihiro Mitsuda, Hirofumi Wada, Koichi Kindo, Hiroyuki Nojiri

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Abstract

A magnetic-field-induced valence transition of Eu(Rh1-xIrx)2Si2 (x = 0.3) has been examined using soft X-ray absorption spectroscopy (XAS) and X-ray magnetic circular dichroism (XMCD) measurements up to 39.3 T. At 9K, the Eu valence number takes a value of 2.65 (±0.03) at 0 T and decreases abruptly to 2.33 (±0.03) at the transition around 22 T. Above the transition field, the magnetization of the Eu2+ component saturates, although the Van Vleck paramagnetism of the Eu3+ linearly increases and reaches 0.65 μB=Eu3+ at 39 T. The valence determined by XAS and the saturation value of the bulk magnetization are mutually consistent. It is found that the transition field determined by XMCD differs from that of the bulk magnetization. To interpret the discrepancy, we discuss the sample inhomogeneity and the effect of the surface state.

Original languageEnglish
Article number054706
Journaljournal of the physical society of japan
Volume86
Issue number5
DOIs
Publication statusPublished - May 15 2017

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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