A 3nm-thick, quasi-single crystalline Cu layer with ultralow optoelectrical losses and exceptional durability

Eunwook Jeong, Yoshifumi Ikoma, Taehyeong Lee, Hyejin Kim, Seung Min Yu, Sang Geul Lee, Jong Seong Bae, Seung Zeon Han, Gun Hwan Lee, Dooho Choi, Eun Ae Choi, Jungheum Yun

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