A capture-safe test generation scheme for at-speed scan testing

X. Wen, K. Miyase, S. Kajihara, H. Furukawa, Y. Yamato, A. Takashima, K. Noda, H. Ito, K. Hatayama, T. Aikyo, K. K. Saluja

Research output: Chapter in Book/Report/Conference proceedingConference contribution

34 Citations (Scopus)

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Engineering & Materials Science