A capture-safety checking metric based on transition-time-relation for at-speed scan testing

Kohei Miyase, Ryota Sakai, Xiaoqing Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Test power has become a critical issue, especially for lowpower devices with deeply optimized functional power profiles. Particularly, excessive capture power in at-speed scan testing may cause timing failures that result in test-induced yield loss. This has made capturesafety checking mandatory for test vectors. However, previous capturesafety checking metrics suffer from inadequate accuracy since they ignore the time relations among different transitions caused by a test vector in a circuit. This paper presents a novel metric called the Transition-Time-Relation-based (TTR) metric which takes transition time relations into consideration in capture-safety checking. Detailed analysis done on an industrial circuit has demonstrated the advantages of the TTR metric. Capturesafety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation.

Original languageEnglish
Pages (from-to)2003-2011
Number of pages9
JournalIEICE Transactions on Information and Systems
VolumeE96-D
Issue number9
DOIs
Publication statusPublished - Sep 2013

Fingerprint

Testing
Networks (circuits)

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering
  • Artificial Intelligence

Cite this

A capture-safety checking metric based on transition-time-relation for at-speed scan testing. / Miyase, Kohei; Sakai, Ryota; Wen, Xiaoqing; Aso, Masao; Furukawa, Hiroshi; Yamato, Yuta; Kajihara, Seiji.

In: IEICE Transactions on Information and Systems, Vol. E96-D, No. 9, 09.2013, p. 2003-2011.

Research output: Contribution to journalArticle

Miyase, K, Sakai, R, Wen, X, Aso, M, Furukawa, H, Yamato, Y & Kajihara, S 2013, 'A capture-safety checking metric based on transition-time-relation for at-speed scan testing', IEICE Transactions on Information and Systems, vol. E96-D, no. 9, pp. 2003-2011. https://doi.org/10.1587/transinf.E96.D.2003
Miyase, Kohei ; Sakai, Ryota ; Wen, Xiaoqing ; Aso, Masao ; Furukawa, Hiroshi ; Yamato, Yuta ; Kajihara, Seiji. / A capture-safety checking metric based on transition-time-relation for at-speed scan testing. In: IEICE Transactions on Information and Systems. 2013 ; Vol. E96-D, No. 9. pp. 2003-2011.
@article{9e173db22765467ea9422dc822c305ec,
title = "A capture-safety checking metric based on transition-time-relation for at-speed scan testing",
abstract = "Test power has become a critical issue, especially for lowpower devices with deeply optimized functional power profiles. Particularly, excessive capture power in at-speed scan testing may cause timing failures that result in test-induced yield loss. This has made capturesafety checking mandatory for test vectors. However, previous capturesafety checking metrics suffer from inadequate accuracy since they ignore the time relations among different transitions caused by a test vector in a circuit. This paper presents a novel metric called the Transition-Time-Relation-based (TTR) metric which takes transition time relations into consideration in capture-safety checking. Detailed analysis done on an industrial circuit has demonstrated the advantages of the TTR metric. Capturesafety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation.",
author = "Kohei Miyase and Ryota Sakai and Xiaoqing Wen and Masao Aso and Hiroshi Furukawa and Yuta Yamato and Seiji Kajihara",
year = "2013",
month = "9",
doi = "10.1587/transinf.E96.D.2003",
language = "English",
volume = "E96-D",
pages = "2003--2011",
journal = "IEICE Transactions on Information and Systems",
issn = "0916-8532",
publisher = "一般社団法人電子情報通信学会",
number = "9",

}

TY - JOUR

T1 - A capture-safety checking metric based on transition-time-relation for at-speed scan testing

AU - Miyase, Kohei

AU - Sakai, Ryota

AU - Wen, Xiaoqing

AU - Aso, Masao

AU - Furukawa, Hiroshi

AU - Yamato, Yuta

AU - Kajihara, Seiji

PY - 2013/9

Y1 - 2013/9

N2 - Test power has become a critical issue, especially for lowpower devices with deeply optimized functional power profiles. Particularly, excessive capture power in at-speed scan testing may cause timing failures that result in test-induced yield loss. This has made capturesafety checking mandatory for test vectors. However, previous capturesafety checking metrics suffer from inadequate accuracy since they ignore the time relations among different transitions caused by a test vector in a circuit. This paper presents a novel metric called the Transition-Time-Relation-based (TTR) metric which takes transition time relations into consideration in capture-safety checking. Detailed analysis done on an industrial circuit has demonstrated the advantages of the TTR metric. Capturesafety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation.

AB - Test power has become a critical issue, especially for lowpower devices with deeply optimized functional power profiles. Particularly, excessive capture power in at-speed scan testing may cause timing failures that result in test-induced yield loss. This has made capturesafety checking mandatory for test vectors. However, previous capturesafety checking metrics suffer from inadequate accuracy since they ignore the time relations among different transitions caused by a test vector in a circuit. This paper presents a novel metric called the Transition-Time-Relation-based (TTR) metric which takes transition time relations into consideration in capture-safety checking. Detailed analysis done on an industrial circuit has demonstrated the advantages of the TTR metric. Capturesafety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation.

UR - http://www.scopus.com/inward/record.url?scp=84883544569&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84883544569&partnerID=8YFLogxK

U2 - 10.1587/transinf.E96.D.2003

DO - 10.1587/transinf.E96.D.2003

M3 - Article

AN - SCOPUS:84883544569

VL - E96-D

SP - 2003

EP - 2011

JO - IEICE Transactions on Information and Systems

JF - IEICE Transactions on Information and Systems

SN - 0916-8532

IS - 9

ER -