Abstract
Analytical techniques of atom probe-field ion microscopy (AP-FIM) and high resolution electron microscopy (HREM) are well suited to the microcharacterization of microstructures. By combining AP-FIM with HREM, it is possible to obtain more accurate structural and chemical information of microstructures. This paper reports the first HREM observation of the tip specimen for AP-FIM analysis. In the present study, the advantage of the combined AP-FIM/HREM technique is demonstrated through the characterization of microstructures in a Mn-added TiAl intermetallic compound.
| Original language | English |
|---|---|
| Pages (from-to) | 231-237 |
| Number of pages | 7 |
| Journal | Surface Science |
| Volume | 246 |
| Issue number | 1-3 |
| DOIs | |
| Publication status | Published - Apr 3 1991 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry
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Saga, M., Uemori, R., Tanino, M., & Morikawa, H. (1991). A combined AP-FIM/HREM approach to the characterization of microstructure in a Mn-added TiAl intermetallic compound. Surface Science, 246(1-3), 231-237. https://doi.org/10.1016/0039-6028(91)90420-W