Abstract
Analytical techniques of atom probe-field ion microscopy (AP-FIM) and high resolution electron microscopy (HREM) are well suited to the microcharacterization of microstructures. By combining AP-FIM with HREM, it is possible to obtain more accurate structural and chemical information of microstructures. This paper reports the first HREM observation of the tip specimen for AP-FIM analysis. In the present study, the advantage of the combined AP-FIM/HREM technique is demonstrated through the characterization of microstructures in a Mn-added TiAl intermetallic compound.
| Original language | English |
|---|---|
| Pages (from-to) | 231-237 |
| Number of pages | 7 |
| Journal | Surface Science |
| Volume | 246 |
| Issue number | 1-3 |
| DOIs | |
| Publication status | Published - Apr 3 1991 |
| Externally published | Yes |
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All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry
Cite this
A combined AP-FIM/HREM approach to the characterization of microstructure in a Mn-added TiAl intermetallic compound. / Saga, M.; Uemori, Ryuji; Tanino, M.; Morikawa, H.
In: Surface Science, Vol. 246, No. 1-3, 03.04.1991, p. 231-237.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - A combined AP-FIM/HREM approach to the characterization of microstructure in a Mn-added TiAl intermetallic compound
AU - Saga, M.
AU - Uemori, Ryuji
AU - Tanino, M.
AU - Morikawa, H.
PY - 1991/4/3
Y1 - 1991/4/3
N2 - Analytical techniques of atom probe-field ion microscopy (AP-FIM) and high resolution electron microscopy (HREM) are well suited to the microcharacterization of microstructures. By combining AP-FIM with HREM, it is possible to obtain more accurate structural and chemical information of microstructures. This paper reports the first HREM observation of the tip specimen for AP-FIM analysis. In the present study, the advantage of the combined AP-FIM/HREM technique is demonstrated through the characterization of microstructures in a Mn-added TiAl intermetallic compound.
AB - Analytical techniques of atom probe-field ion microscopy (AP-FIM) and high resolution electron microscopy (HREM) are well suited to the microcharacterization of microstructures. By combining AP-FIM with HREM, it is possible to obtain more accurate structural and chemical information of microstructures. This paper reports the first HREM observation of the tip specimen for AP-FIM analysis. In the present study, the advantage of the combined AP-FIM/HREM technique is demonstrated through the characterization of microstructures in a Mn-added TiAl intermetallic compound.
UR - http://www.scopus.com/inward/record.url?scp=0026138187&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0026138187&partnerID=8YFLogxK
U2 - 10.1016/0039-6028(91)90420-W
DO - 10.1016/0039-6028(91)90420-W
M3 - Article
AN - SCOPUS:0026138187
VL - 246
SP - 231
EP - 237
JO - Surface Science
JF - Surface Science
SN - 0039-6028
IS - 1-3
ER -