A combined AP-FIM/HREM approach to the characterization of microstructure in a Mn-added TiAl intermetallic compound

M. Saga, Ryuji Uemori, M. Tanino, H. Morikawa

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Analytical techniques of atom probe-field ion microscopy (AP-FIM) and high resolution electron microscopy (HREM) are well suited to the microcharacterization of microstructures. By combining AP-FIM with HREM, it is possible to obtain more accurate structural and chemical information of microstructures. This paper reports the first HREM observation of the tip specimen for AP-FIM analysis. In the present study, the advantage of the combined AP-FIM/HREM technique is demonstrated through the characterization of microstructures in a Mn-added TiAl intermetallic compound.

Original languageEnglish
Pages (from-to)231-237
Number of pages7
JournalSurface Science
Volume246
Issue number1-3
DOIs
Publication statusPublished - Apr 3 1991
Externally publishedYes

Fingerprint

High resolution electron microscopy
Intermetallics
intermetallics
electron microscopy
Microscopic examination
Ions
microscopy
Atoms
microstructure
Microstructure
probes
high resolution
atoms
ions

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

A combined AP-FIM/HREM approach to the characterization of microstructure in a Mn-added TiAl intermetallic compound. / Saga, M.; Uemori, Ryuji; Tanino, M.; Morikawa, H.

In: Surface Science, Vol. 246, No. 1-3, 03.04.1991, p. 231-237.

Research output: Contribution to journalArticle

@article{d5bb361b68714f728aa14c002c1d0421,
title = "A combined AP-FIM/HREM approach to the characterization of microstructure in a Mn-added TiAl intermetallic compound",
abstract = "Analytical techniques of atom probe-field ion microscopy (AP-FIM) and high resolution electron microscopy (HREM) are well suited to the microcharacterization of microstructures. By combining AP-FIM with HREM, it is possible to obtain more accurate structural and chemical information of microstructures. This paper reports the first HREM observation of the tip specimen for AP-FIM analysis. In the present study, the advantage of the combined AP-FIM/HREM technique is demonstrated through the characterization of microstructures in a Mn-added TiAl intermetallic compound.",
author = "M. Saga and Ryuji Uemori and M. Tanino and H. Morikawa",
year = "1991",
month = "4",
day = "3",
doi = "10.1016/0039-6028(91)90420-W",
language = "English",
volume = "246",
pages = "231--237",
journal = "Surface Science",
issn = "0039-6028",
publisher = "Elsevier",
number = "1-3",

}

TY - JOUR

T1 - A combined AP-FIM/HREM approach to the characterization of microstructure in a Mn-added TiAl intermetallic compound

AU - Saga, M.

AU - Uemori, Ryuji

AU - Tanino, M.

AU - Morikawa, H.

PY - 1991/4/3

Y1 - 1991/4/3

N2 - Analytical techniques of atom probe-field ion microscopy (AP-FIM) and high resolution electron microscopy (HREM) are well suited to the microcharacterization of microstructures. By combining AP-FIM with HREM, it is possible to obtain more accurate structural and chemical information of microstructures. This paper reports the first HREM observation of the tip specimen for AP-FIM analysis. In the present study, the advantage of the combined AP-FIM/HREM technique is demonstrated through the characterization of microstructures in a Mn-added TiAl intermetallic compound.

AB - Analytical techniques of atom probe-field ion microscopy (AP-FIM) and high resolution electron microscopy (HREM) are well suited to the microcharacterization of microstructures. By combining AP-FIM with HREM, it is possible to obtain more accurate structural and chemical information of microstructures. This paper reports the first HREM observation of the tip specimen for AP-FIM analysis. In the present study, the advantage of the combined AP-FIM/HREM technique is demonstrated through the characterization of microstructures in a Mn-added TiAl intermetallic compound.

UR - http://www.scopus.com/inward/record.url?scp=0026138187&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0026138187&partnerID=8YFLogxK

U2 - 10.1016/0039-6028(91)90420-W

DO - 10.1016/0039-6028(91)90420-W

M3 - Article

AN - SCOPUS:0026138187

VL - 246

SP - 231

EP - 237

JO - Surface Science

JF - Surface Science

SN - 0039-6028

IS - 1-3

ER -