A combined AP-FIM/HREM approach to the characterization of microstructure in a Mn-added TiAl intermetallic compound

M. Saga; R. Uemori; M. Tanino; H. Morikawa

doi:10.1016/0039-6028(91)90420-W

A combined AP-FIM/HREM approach to the characterization of microstructure in a Mn-added TiAl intermetallic compound

M. Saga, R. Uemori, M. Tanino, H. Morikawa

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

Abstract

Analytical techniques of atom probe-field ion microscopy (AP-FIM) and high resolution electron microscopy (HREM) are well suited to the microcharacterization of microstructures. By combining AP-FIM with HREM, it is possible to obtain more accurate structural and chemical information of microstructures. This paper reports the first HREM observation of the tip specimen for AP-FIM analysis. In the present study, the advantage of the combined AP-FIM/HREM technique is demonstrated through the characterization of microstructures in a Mn-added TiAl intermetallic compound.

Original language	English
Pages (from-to)	231-237
Number of pages	7
Journal	Surface Science
Volume	246
Issue number	1-3
DOIs	https://doi.org/10.1016/0039-6028(91)90420-W
Publication status	Published - Apr 3 1991
Externally published	Yes

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/0039-6028(91)90420-W

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title = "A combined AP-FIM/HREM approach to the characterization of microstructure in a Mn-added TiAl intermetallic compound",

abstract = "Analytical techniques of atom probe-field ion microscopy (AP-FIM) and high resolution electron microscopy (HREM) are well suited to the microcharacterization of microstructures. By combining AP-FIM with HREM, it is possible to obtain more accurate structural and chemical information of microstructures. This paper reports the first HREM observation of the tip specimen for AP-FIM analysis. In the present study, the advantage of the combined AP-FIM/HREM technique is demonstrated through the characterization of microstructures in a Mn-added TiAl intermetallic compound.",

author = "M. Saga and R. Uemori and M. Tanino and H. Morikawa",

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T1 - A combined AP-FIM/HREM approach to the characterization of microstructure in a Mn-added TiAl intermetallic compound

AU - Saga, M.

AU - Uemori, R.

AU - Tanino, M.

AU - Morikawa, H.

PY - 1991/4/3

Y1 - 1991/4/3

N2 - Analytical techniques of atom probe-field ion microscopy (AP-FIM) and high resolution electron microscopy (HREM) are well suited to the microcharacterization of microstructures. By combining AP-FIM with HREM, it is possible to obtain more accurate structural and chemical information of microstructures. This paper reports the first HREM observation of the tip specimen for AP-FIM analysis. In the present study, the advantage of the combined AP-FIM/HREM technique is demonstrated through the characterization of microstructures in a Mn-added TiAl intermetallic compound.

AB - Analytical techniques of atom probe-field ion microscopy (AP-FIM) and high resolution electron microscopy (HREM) are well suited to the microcharacterization of microstructures. By combining AP-FIM with HREM, it is possible to obtain more accurate structural and chemical information of microstructures. This paper reports the first HREM observation of the tip specimen for AP-FIM analysis. In the present study, the advantage of the combined AP-FIM/HREM technique is demonstrated through the characterization of microstructures in a Mn-added TiAl intermetallic compound.

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M3 - Article

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SP - 231

EP - 237

JO - Surface Science

JF - Surface Science

SN - 0039-6028

IS - 1-3

ER -

A combined AP-FIM/HREM approach to the characterization of microstructure in a Mn-added TiAl intermetallic compound

Abstract

All Science Journal Classification (ASJC) codes

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