A combined AP-FIM/HREM approach to the characterization of microstructure in a Mn-added TiAl intermetallic compound

M. Saga, R. Uemori, M. Tanino, H. Morikawa

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Analytical techniques of atom probe-field ion microscopy (AP-FIM) and high resolution electron microscopy (HREM) are well suited to the microcharacterization of microstructures. By combining AP-FIM with HREM, it is possible to obtain more accurate structural and chemical information of microstructures. This paper reports the first HREM observation of the tip specimen for AP-FIM analysis. In the present study, the advantage of the combined AP-FIM/HREM technique is demonstrated through the characterization of microstructures in a Mn-added TiAl intermetallic compound.

Original languageEnglish
Pages (from-to)231-237
Number of pages7
JournalSurface Science
Volume246
Issue number1-3
DOIs
Publication statusPublished - Apr 3 1991
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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