A combined environmental straining specimen holder for high-voltage electron microscopy

Yoshimasa Takahashi, Masaki Tanaka, Kenji Higashida, Kazuhiro Yasuda, Syo Matsumura, Hiroshi Noguchi

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

A novel specimen holder that enables in situ observation of crack-tip deformation and/or fracture under a controlled environment is developed for a high-voltage electron microscope (HVEM). A window-type environmental cell (EC) that incorporates a uniaxial straining apparatus is built into a side-entry-type single-tilt specimen holder. The gas control in EC, straining apparatus design, limited field of view for crack-tip observation, and specimen preparation for the specimen holder are presented in detail. Experimental results successfully demonstrate that the developed specimen holder is quite useful for the dynamic observation of crack-tip deformation and/or fracture subjected to a hostile environment, such as hydrogen gas.

Original languageEnglish
Pages (from-to)1420-1427
Number of pages8
JournalUltramicroscopy
Volume110
Issue number11
DOIs
Publication statusPublished - Oct 1 2010

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Electronic, Optical and Magnetic Materials

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