A GA-based method for high-quality X-filling to reduce launch switching activity in at-speed scan testing

Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

Power-aware X-filling is a preferable approach to avoiding IR-drop-induced yield loss in at-speed scan testing. However, the quality of previous X-filling methods for reducing launch switching activity may be unsatisfactory, due to low effect (insufficient and global-only reduction) and/or low scalability (long CPU time). This paper addresses this quality problem with a novel, GA (Genetic Algorithm) based X-filling method, called GA-fill. Its goals are (1) to achieve both effectiveness and scalability in a more balanced manner, and (2) to make the reduction effect of launch switching activity more concentrated on critical areas that have higher impact on IR-drop-induced yield loss. Evaluation experiments are being conducted on benchmark and industrial circuits, and initial results have demonstrated the usefulness of GA-fill.

Original languageEnglish
Title of host publication2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2009
Pages81-86
Number of pages6
DOIs
Publication statusPublished - Dec 1 2009
Event2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2009 - Shanghai, China
Duration: Nov 16 2009Nov 18 2009

Publication series

Name2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2009

Other

Other2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2009
CountryChina
CityShanghai
Period11/16/0911/18/09

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All Science Journal Classification (ASJC) codes

  • Computational Theory and Mathematics
  • Software

Cite this

Yamato, Y., Wen, X., Miyase, K., Furukawa, H., & Kajihara, S. (2009). A GA-based method for high-quality X-filling to reduce launch switching activity in at-speed scan testing. In 2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2009 (pp. 81-86). [5368216] (2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2009). https://doi.org/10.1109/PRDC.2009.21