A GA-Based X-Filling for reducing launch switching activity toward specific objectives in at-speed scan testing

Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara

Research output: Contribution to journalArticle

Abstract

Power-aware X-filling is a preferable approach to avoiding IR-drop-induced yield loss in at-speed scan testing. However, the ability of previous X-filling methods to reduce launch switching activity may be unsatisfactory, due to low effect (insufficient and global-only reduction) and/or low scalability (long CPU time). This paper addresses this reduction quality problem with a novel GA (Genetic Algorithm) based X-filling method, called GA-fill. Its goals are (1) to achieve both effectiveness and scalability in a more balanced manner and (2) to make the reduction effect of launch switching activity more concentrated on critical areas that have higher impact on IR-drop-induced yield loss. Evaluation experiments are being conducted on both benchmark and industrial circuits, and the results have demonstrated the usefulness of GA-fill.

Original languageEnglish
Pages (from-to)833-840
Number of pages8
JournalIEICE Transactions on Information and Systems
VolumeE94-D
Issue number4
DOIs
Publication statusPublished - Jan 1 2011

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Genetic algorithms
Scalability
Testing
Program processors
Networks (circuits)
Experiments

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Artificial Intelligence
  • Electrical and Electronic Engineering

Cite this

A GA-Based X-Filling for reducing launch switching activity toward specific objectives in at-speed scan testing. / Yamato, Yuta; Wen, Xiaoqing; Miyase, Kohei; Furukawa, Hiroshi; Kajihara, Seiji.

In: IEICE Transactions on Information and Systems, Vol. E94-D, No. 4, 01.01.2011, p. 833-840.

Research output: Contribution to journalArticle

Yamato, Yuta ; Wen, Xiaoqing ; Miyase, Kohei ; Furukawa, Hiroshi ; Kajihara, Seiji. / A GA-Based X-Filling for reducing launch switching activity toward specific objectives in at-speed scan testing. In: IEICE Transactions on Information and Systems. 2011 ; Vol. E94-D, No. 4. pp. 833-840.
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