A model for quantitative evaluation of the magnetic field caused by eddy current interaction with a flaw in conductor plates

H. Bayani, I. Sasada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationINTERMAG ASIA 2005
Subtitle of host publicationDigests of the IEEE International Magnetics Conference
PublisherIEEE Computer Society
Pages1815-1816
Number of pages2
ISBN (Print)0780390091, 9780780390096
DOIs
Publication statusPublished - 2005
EventINTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference - Nagoya, Japan
Duration: Apr 4 2005Apr 8 2005

Publication series

NameINTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference

Other

OtherINTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference
CountryJapan
CityNagoya
Period4/4/054/8/05

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Bayani, H., & Sasada, I. (2005). A model for quantitative evaluation of the magnetic field caused by eddy current interaction with a flaw in conductor plates. In INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference (pp. 1815-1816). [GV 01] (INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference). IEEE Computer Society. https://doi.org/10.1109/intmag.2005.1464341