A Monte Carlo-shear lag simulation of tensile fracture behaviour of Bi2223 filament

S. Ochiai, T. Ishida, D. Doko, Kohei Morishita, H. Okuda, S. S. Oh, D. W. Ha, M. Hojo, M. Tanaka, M. Sugano, K. Osamura

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

The damage evolution in Bi2223 filaments and its influence on critical current was described by a Monte Carlo-shear lag simulation method. The experimentally observed zigzag crack propagation across aligned Bi2223 grains under tensile strain was effectively modelled by including transverse and longitudinal failure modes for individual grains. From the simulated stress-strain curve, the survival parameter (slope of the stress-strain curve normalized with respect to the original Young's modulus) was estimated with increasing applied strain. With this parameter combined with the strain sensitivity of the critical current, the measured change of critical current of the composite tape with applied strain could be described well.

Original languageEnglish
JournalSuperconductor Science and Technology
Volume18
Issue number12
DOIs
Publication statusPublished - Dec 1 2005
Externally publishedYes

Fingerprint

Critical currents
critical current
filaments
time lag
Stress-strain curves
shear
simulation
Tensile strain
failure modes
crack propagation
curves
Tapes
Failure modes
tapes
Crack propagation
modulus of elasticity
Elastic moduli
slopes
damage
composite materials

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites
  • Condensed Matter Physics
  • Metals and Alloys
  • Electrical and Electronic Engineering
  • Materials Chemistry

Cite this

A Monte Carlo-shear lag simulation of tensile fracture behaviour of Bi2223 filament. / Ochiai, S.; Ishida, T.; Doko, D.; Morishita, Kohei; Okuda, H.; Oh, S. S.; Ha, D. W.; Hojo, M.; Tanaka, M.; Sugano, M.; Osamura, K.

In: Superconductor Science and Technology, Vol. 18, No. 12, 01.12.2005.

Research output: Contribution to journalArticle

Ochiai, S, Ishida, T, Doko, D, Morishita, K, Okuda, H, Oh, SS, Ha, DW, Hojo, M, Tanaka, M, Sugano, M & Osamura, K 2005, 'A Monte Carlo-shear lag simulation of tensile fracture behaviour of Bi2223 filament', Superconductor Science and Technology, vol. 18, no. 12. https://doi.org/10.1088/0953-2048/18/12/004
Ochiai, S. ; Ishida, T. ; Doko, D. ; Morishita, Kohei ; Okuda, H. ; Oh, S. S. ; Ha, D. W. ; Hojo, M. ; Tanaka, M. ; Sugano, M. ; Osamura, K. / A Monte Carlo-shear lag simulation of tensile fracture behaviour of Bi2223 filament. In: Superconductor Science and Technology. 2005 ; Vol. 18, No. 12.
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