A new method to analyze density fluctuation by microwave reflectometry

Kouji Shinohara, Syun'ichi Shiraiwa, Katsumichi Hoshino, Yukitoshi Miura, Kazuaki Hanada, Hiroshi Toyama

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

The runaway phase phenomenon is a problem in reflectometry measurements. The change in the phase difference between the reflected wave and the reference one cannot be explained by the movement of the cut-off layer when the runaway phase phenomenon occurs. It is difficult to extract information of the density fluctuation from the data with the runaway phase. We show a model in which the runaway phase phenomenon comes from the wave scattered by the density fluctuations, and describe a new analysis method based on this model. The obtained results on plasma displacement and density fluctuation spectrum are presented.

Original languageEnglish
Pages (from-to)7367-7374
Number of pages8
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume36
Issue number12 A
DOIs
Publication statusPublished - Jan 1 1997
Externally publishedYes

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Microwaves
microwaves
reflected waves
Plasmas
cut-off

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

A new method to analyze density fluctuation by microwave reflectometry. / Shinohara, Kouji; Shiraiwa, Syun'ichi; Hoshino, Katsumichi; Miura, Yukitoshi; Hanada, Kazuaki; Toyama, Hiroshi.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 36, No. 12 A, 01.01.1997, p. 7367-7374.

Research output: Contribution to journalArticle

Shinohara, Kouji ; Shiraiwa, Syun'ichi ; Hoshino, Katsumichi ; Miura, Yukitoshi ; Hanada, Kazuaki ; Toyama, Hiroshi. / A new method to analyze density fluctuation by microwave reflectometry. In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 1997 ; Vol. 36, No. 12 A. pp. 7367-7374.
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