Abstract
This paper presents a comprehensive online condition monitoring algorithm for power semiconductor devices. The proposed algorithm utilizes the voltage measurement between the collector and emitter of power semiconductor devices to fully monitor the performance and state of the device. The proposed algorithm provides four different detection and monitoring conditions of the device; these four elements are open-circuit fault detection, short circuit fault detection, overheating fault detection, remaining useful lifetime estimation. Compared to the previously addressed approaches in the literature, the proposed algorithm provides full state monitoring and detection of the device using only one sensed quantity. The collector-emitter voltage measurement of the device is chosen for implementing the proposed algorithm for its generality as it can be applied to various semiconductor devices technologies. Additionally, the proposed algorithm provides the advantages of simple implementation, comprehensive condition monitoring, and low cost. The implementation of the full proposed condition monitoring system is provided in the paper with case study application to boost DC-DC converter system. The results and comparisons of the proposed algorithm with previous strategies verify the feasibility of the proposed algorithm.
| Original language | English |
|---|---|
| Title of host publication | 2017 IEEE 3rd International Future Energy Electronics Conference and ECCE Asia, IFEEC - ECCE Asia 2017 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 1473-1477 |
| Number of pages | 5 |
| ISBN (Electronic) | 9781509051571 |
| DOIs | |
| Publication status | Published - Jul 25 2017 |
| Event | 3rd IEEE International Future Energy Electronics Conference and ECCE Asia, IFEEC - ECCE Asia 2017 - Kaohsiung, Taiwan, Province of China Duration: Jun 3 2017 → Jun 7 2017 |
Publication series
| Name | 2017 IEEE 3rd International Future Energy Electronics Conference and ECCE Asia, IFEEC - ECCE Asia 2017 |
|---|
Other
| Other | 3rd IEEE International Future Energy Electronics Conference and ECCE Asia, IFEEC - ECCE Asia 2017 |
|---|---|
| Country | Taiwan, Province of China |
| City | Kaohsiung |
| Period | 6/3/17 → 6/7/17 |
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All Science Journal Classification (ASJC) codes
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering
- Control and Optimization
Cite this
A new real-time perfect condition monitoring for high-power converters. / Aly, Mokhtar; Ahmed, Emad M.; Shoyama, Masahito.
2017 IEEE 3rd International Future Energy Electronics Conference and ECCE Asia, IFEEC - ECCE Asia 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 1473-1477 7992262 (2017 IEEE 3rd International Future Energy Electronics Conference and ECCE Asia, IFEEC - ECCE Asia 2017).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - A new real-time perfect condition monitoring for high-power converters
AU - Aly, Mokhtar
AU - Ahmed, Emad M.
AU - Shoyama, Masahito
PY - 2017/7/25
Y1 - 2017/7/25
N2 - This paper presents a comprehensive online condition monitoring algorithm for power semiconductor devices. The proposed algorithm utilizes the voltage measurement between the collector and emitter of power semiconductor devices to fully monitor the performance and state of the device. The proposed algorithm provides four different detection and monitoring conditions of the device; these four elements are open-circuit fault detection, short circuit fault detection, overheating fault detection, remaining useful lifetime estimation. Compared to the previously addressed approaches in the literature, the proposed algorithm provides full state monitoring and detection of the device using only one sensed quantity. The collector-emitter voltage measurement of the device is chosen for implementing the proposed algorithm for its generality as it can be applied to various semiconductor devices technologies. Additionally, the proposed algorithm provides the advantages of simple implementation, comprehensive condition monitoring, and low cost. The implementation of the full proposed condition monitoring system is provided in the paper with case study application to boost DC-DC converter system. The results and comparisons of the proposed algorithm with previous strategies verify the feasibility of the proposed algorithm.
AB - This paper presents a comprehensive online condition monitoring algorithm for power semiconductor devices. The proposed algorithm utilizes the voltage measurement between the collector and emitter of power semiconductor devices to fully monitor the performance and state of the device. The proposed algorithm provides four different detection and monitoring conditions of the device; these four elements are open-circuit fault detection, short circuit fault detection, overheating fault detection, remaining useful lifetime estimation. Compared to the previously addressed approaches in the literature, the proposed algorithm provides full state monitoring and detection of the device using only one sensed quantity. The collector-emitter voltage measurement of the device is chosen for implementing the proposed algorithm for its generality as it can be applied to various semiconductor devices technologies. Additionally, the proposed algorithm provides the advantages of simple implementation, comprehensive condition monitoring, and low cost. The implementation of the full proposed condition monitoring system is provided in the paper with case study application to boost DC-DC converter system. The results and comparisons of the proposed algorithm with previous strategies verify the feasibility of the proposed algorithm.
UR - http://www.scopus.com/inward/record.url?scp=85034017218&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85034017218&partnerID=8YFLogxK
U2 - 10.1109/IFEEC.2017.7992262
DO - 10.1109/IFEEC.2017.7992262
M3 - Conference contribution
AN - SCOPUS:85034017218
T3 - 2017 IEEE 3rd International Future Energy Electronics Conference and ECCE Asia, IFEEC - ECCE Asia 2017
SP - 1473
EP - 1477
BT - 2017 IEEE 3rd International Future Energy Electronics Conference and ECCE Asia, IFEEC - ECCE Asia 2017
PB - Institute of Electrical and Electronics Engineers Inc.
ER -