Abstract
(Pb, La)(Ti, Zr)O3 films were epitaxially grown on various semiconductive perovskites including (La, Sr)2CuO4,(La, Sr)MnO3,(La, Sr)FeO3,(La, Sr)CoO3, LaNiO3,(Nd, Ce)2CuO4films, and Sr(Ti, Nb)O3.Excellent alignments of the materials in the heterostructures were confirmed by X-ray diffractometry.Using the heterostructures, effects of thecarrier type, the carrier concentration, and the mobility on theferroelectric and dielectric properties were examined. In these heterostructures, the depolarization instability wasso weak that it could not be detected in their polarization hysteresis loops.
| Original language | English |
|---|---|
| Pages (from-to) | 5254-5257 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics |
| Volume | 34 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - Sep 1995 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Engineering(all)
- Physics and Astronomy(all)
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Watanabe, Y., Matsumoto, Y., & Tanamura, M. (1995). A Preliminary Experimental Study on Dielectric Properties of Metal/(Pb, La)(Ti, Zr)O3/Semiconductive Perovskite Heterostructures. Japanese Journal of Applied Physics, 34(9), 5254-5257. https://doi.org/10.1143/JJAP.34.5254