Abstract
To measure and improve linearities of the Flash ADCs used in the integrated VME ADC modules, pulses with exponentially falling tail were digitized and the counts of the resultant digital codes were recorded. The obtained histogram of the codes was fit to a function to deduce a smoothly varying curve which corresponds to that obtained in the case of ideal linearity, and was compared to the fit to calculate width as well as differential nonlinearity of each code. The obtained differential nonlinearities go down to as low as ∼0.7 LSB. A simple method is proposed to improve the nonlinearity using the differential nonlinearities in the post-processor following the ADC.
Original language | English |
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Title of host publication | 2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009 |
Pages | 2229-2233 |
Number of pages | 5 |
DOIs | |
Publication status | Published - Dec 1 2009 |
Externally published | Yes |
Event | 2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009 - Orlando, FL, United States Duration: Oct 25 2009 → Oct 31 2009 |
Other
Other | 2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009 |
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Country/Territory | United States |
City | Orlando, FL |
Period | 10/25/09 → 10/31/09 |
All Science Journal Classification (ASJC) codes
- Radiation
- Nuclear and High Energy Physics
- Radiology Nuclear Medicine and imaging