A simple method to measure and improve linearity of flash ADCS used in integrated VME ADC modules

Kazuyoshi Furutaka; Atsushi Kimura; Mitsuo Koizumi; Yosuke Toh; Tadahiro Kin; Shoji Nakamura; Masumi Oshima

doi:10.1109/NSSMIC.2009.5402078

A simple method to measure and improve linearity of flash ADCS used in integrated VME ADC modules

Kazuyoshi Furutaka, Atsushi Kimura, Mitsuo Koizumi, Yosuke Toh, Tadahiro Kin, Shoji Nakamura, Masumi Oshima

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

To measure and improve linearities of the Flash ADCs used in the integrated VME ADC modules, pulses with exponentially falling tail were digitized and the counts of the resultant digital codes were recorded. The obtained histogram of the codes was fit to a function to deduce a smoothly varying curve which corresponds to that obtained in the case of ideal linearity, and was compared to the fit to calculate width as well as differential nonlinearity of each code. The obtained differential nonlinearities go down to as low as ∼0.7 LSB. A simple method is proposed to improve the nonlinearity using the differential nonlinearities in the post-processor following the ADC.

Original language	English
Title of host publication	2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009
Pages	2229-2233
Number of pages	5
DOIs	https://doi.org/10.1109/NSSMIC.2009.5402078
Publication status	Published - Dec 1 2009
Externally published	Yes
Event	2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009 - Orlando, FL, United States Duration: Oct 25 2009 → Oct 31 2009

Other

Other	2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009
Country	United States
City	Orlando, FL
Period	10/25/09 → 10/31/09

All Science Journal Classification (ASJC) codes

Radiation
Nuclear and High Energy Physics
Radiology Nuclear Medicine and imaging

Access to Document

10.1109/NSSMIC.2009.5402078

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A simple method to measure and improve linearity of flash ADCS used in integrated VME ADC modules. / Furutaka, Kazuyoshi; Kimura, Atsushi; Koizumi, Mitsuo; Toh, Yosuke; Kin, Tadahiro; Nakamura, Shoji; Oshima, Masumi.

2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009. 2009. p. 2229-2233 5402078.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Furutaka, K, Kimura, A, Koizumi, M, Toh, Y, Kin, T, Nakamura, S & Oshima, M 2009, A simple method to measure and improve linearity of flash ADCS used in integrated VME ADC modules. in 2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009., 5402078, pp. 2229-2233, 2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009, Orlando, FL, United States, 10/25/09. https://doi.org/10.1109/NSSMIC.2009.5402078

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abstract = "To measure and improve linearities of the Flash ADCs used in the integrated VME ADC modules, pulses with exponentially falling tail were digitized and the counts of the resultant digital codes were recorded. The obtained histogram of the codes was fit to a function to deduce a smoothly varying curve which corresponds to that obtained in the case of ideal linearity, and was compared to the fit to calculate width as well as differential nonlinearity of each code. The obtained differential nonlinearities go down to as low as ∼0.7 LSB. A simple method is proposed to improve the nonlinearity using the differential nonlinearities in the post-processor following the ADC.",

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AU - Furutaka, Kazuyoshi

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AU - Kin, Tadahiro

AU - Nakamura, Shoji

AU - Oshima, Masumi

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AB - To measure and improve linearities of the Flash ADCs used in the integrated VME ADC modules, pulses with exponentially falling tail were digitized and the counts of the resultant digital codes were recorded. The obtained histogram of the codes was fit to a function to deduce a smoothly varying curve which corresponds to that obtained in the case of ideal linearity, and was compared to the fit to calculate width as well as differential nonlinearity of each code. The obtained differential nonlinearities go down to as low as ∼0.7 LSB. A simple method is proposed to improve the nonlinearity using the differential nonlinearities in the post-processor following the ADC.

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