A simple method to measure and improve linearity of flash ADCS used in integrated VME ADC modules

Kazuyoshi Furutaka, Atsushi Kimura, Mitsuo Koizumi, Yosuke Toh, Tadahiro Kin, Shoji Nakamura, Masumi Oshima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

To measure and improve linearities of the Flash ADCs used in the integrated VME ADC modules, pulses with exponentially falling tail were digitized and the counts of the resultant digital codes were recorded. The obtained histogram of the codes was fit to a function to deduce a smoothly varying curve which corresponds to that obtained in the case of ideal linearity, and was compared to the fit to calculate width as well as differential nonlinearity of each code. The obtained differential nonlinearities go down to as low as ∼0.7 LSB. A simple method is proposed to improve the nonlinearity using the differential nonlinearities in the post-processor following the ADC.

Original languageEnglish
Title of host publication2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009
Pages2229-2233
Number of pages5
DOIs
Publication statusPublished - Dec 1 2009
Externally publishedYes
Event2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009 - Orlando, FL, United States
Duration: Oct 25 2009Oct 31 2009

Other

Other2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009
CountryUnited States
CityOrlando, FL
Period10/25/0910/31/09

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All Science Journal Classification (ASJC) codes

  • Radiation
  • Nuclear and High Energy Physics
  • Radiology Nuclear Medicine and imaging

Cite this

Furutaka, K., Kimura, A., Koizumi, M., Toh, Y., Kin, T., Nakamura, S., & Oshima, M. (2009). A simple method to measure and improve linearity of flash ADCS used in integrated VME ADC modules. In 2009 IEEE Nuclear Science Symposium Conference Record, NSS/MIC 2009 (pp. 2229-2233). [5402078] https://doi.org/10.1109/NSSMIC.2009.5402078