TY - GEN
T1 - A simulation-based soft error estimation methodology for computer systems
AU - Sugihara, Makoto
AU - Ishihara, Tohru
AU - Hashimoto, Koji
AU - Muroyama, Masanori
N1 - Copyright:
Copyright 2013 Elsevier B.V., All rights reserved.
PY - 2006
Y1 - 2006
N2 - This paper proposes a simulation-based soft error estimation methodology for computer systems. Accumulating soft error rates (SERs) of all memories in a computer system results in pessimistic soft error estimation. This is because memory cells are used spatially and temporally and not all soft errors in them make the computer system faulty. Our soft-error estimation methodology considers the locations and the timings of soft errors occurring at every level of memory hierarchy and estimates the soft errors of the whole system using instruction-set simulation. Our experiment demonstrates that the reliability of computer systems depends on not only SERs of memories but also the behavior of software running on the systems.
AB - This paper proposes a simulation-based soft error estimation methodology for computer systems. Accumulating soft error rates (SERs) of all memories in a computer system results in pessimistic soft error estimation. This is because memory cells are used spatially and temporally and not all soft errors in them make the computer system faulty. Our soft-error estimation methodology considers the locations and the timings of soft errors occurring at every level of memory hierarchy and estimates the soft errors of the whole system using instruction-set simulation. Our experiment demonstrates that the reliability of computer systems depends on not only SERs of memories but also the behavior of software running on the systems.
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U2 - 10.1109/ISQED.2006.16
DO - 10.1109/ISQED.2006.16
M3 - Conference contribution
AN - SCOPUS:34548368425
SN - 0769525237
SN - 9780769525235
T3 - Proceedings - International Symposium on Quality Electronic Design, ISQED
SP - 196
EP - 203
BT - Proceedings - 7th International Symposium on Quality Electronic Design, ISQED 2006
T2 - 7th International Symposium on Quality Electronic Design, ISQED 2006
Y2 - 27 March 2006 through 29 March 2006
ER -