A simulation-based soft error estimation methodology for computer systems

Makoto Sugihara, Tohru Ishihara, Koji Hashimoto, Masanori Muroyama

Research output: Chapter in Book/Report/Conference proceedingConference contribution

16 Citations (Scopus)

Abstract

This paper proposes a simulation-based soft error estimation methodology for computer systems. Accumulating soft error rates (SERs) of all memories in a computer system results in pessimistic soft error estimation. This is because memory cells are used spatially and temporally and not all soft errors in them make the computer system faulty. Our soft-error estimation methodology considers the locations and the timings of soft errors occurring at every level of memory hierarchy and estimates the soft errors of the whole system using instruction-set simulation. Our experiment demonstrates that the reliability of computer systems depends on not only SERs of memories but also the behavior of software running on the systems.

Original languageEnglish
Title of host publicationProceedings - 7th International Symposium on Quality Electronic Design, ISQED 2006
Pages196-203
Number of pages8
DOIs
Publication statusPublished - Dec 1 2006
Event7th International Symposium on Quality Electronic Design, ISQED 2006 - San Jose, CA, United States
Duration: Mar 27 2006Mar 29 2006

Publication series

NameProceedings - International Symposium on Quality Electronic Design, ISQED
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295

Other

Other7th International Symposium on Quality Electronic Design, ISQED 2006
CountryUnited States
CitySan Jose, CA
Period3/27/063/29/06

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Sugihara, M., Ishihara, T., Hashimoto, K., & Muroyama, M. (2006). A simulation-based soft error estimation methodology for computer systems. In Proceedings - 7th International Symposium on Quality Electronic Design, ISQED 2006 (pp. 196-203). [1613136] (Proceedings - International Symposium on Quality Electronic Design, ISQED). https://doi.org/10.1109/ISQED.2006.16