A study of the reliability of mosfets in two stacked thin chips for 3D system in package

Akihiro Ikeda, Yosuke Sugimoto, Tomonori Kuwada, Satoru Kajiwara, Tsuyoshi Fujimura, Kazuya Iwasaki, Hiroshi Ogi, Kiyoshi Hamaguchi, Hisao Kuriyaki, Reiji Hattori, Yukinori Kuroki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

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