A systematic approach for the reliability of RFID systems

Sozo Inoue, Daisuke Hagiwara, Hiroto Yasuura

Research output: Contribution to conferencePaper

6 Citations (Scopus)

Abstract

In this paper, we address reliability issues in the 'Digitally Named World', which is the environment in which RFID (Radio Frequency Identification) tags are attached to any objects in the real world. We propose a systematic approach to maintain the reliability and analyze the effect of our approach, and show that the possibility of identification failure are reduced to O(p 2) (0 < p < 1) from O(p) of the naive approach, where p is the possibility of failure on a single reader, on condition that the first and the final identifications of an object are ensured to be successful.

Original languageEnglish
PagesB183-B186
Publication statusPublished - 2004
EventIEEE TENCON 2004 - 2004 IEEE Region 10 Conference: Analog and Digital Techniques in Electrical Engineering - Chiang Mai, Thailand
Duration: Nov 21 2004Nov 24 2004

Other

OtherIEEE TENCON 2004 - 2004 IEEE Region 10 Conference: Analog and Digital Techniques in Electrical Engineering
CountryThailand
CityChiang Mai
Period11/21/0411/24/04

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

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    Inoue, S., Hagiwara, D., & Yasuura, H. (2004). A systematic approach for the reliability of RFID systems. B183-B186. Paper presented at IEEE TENCON 2004 - 2004 IEEE Region 10 Conference: Analog and Digital Techniques in Electrical Engineering, Chiang Mai, Thailand.