A theory of thermal-fluctuation-induced depinning line in weakly pinning high-Tc superconductors

K. Yamafuji, T. Fujiyoshi, K. Toko, T. Matsuno, K. Kishio, T. Matsushita

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17 Citations (Scopus)

Abstract

The expression for the thermal-fluctuation-induced depinning line, T = TP (Be), is derived theoretically for weakly pinning high-Tc superconductors. In the derivation, it is shown that the thermal displacement of pinned fluxoids, uth reduces the critical current density as Jc = Jc0 ( - 〈u2th〉/d2p) 3 2, where Jc0 is the critical current density in the absence of uth and dp is the effective half width of the summed-up pinning potential. Then Tp (itBe) is determined as the temperature at which Jc becomes zero due to the increase of 〈u2th〉 with the increase of T in the external flux density of Be. The relation of Tp(Be) with the irreversibility line of Ti(Be) and the flux melting line of Tm(Be) is also discussed.

Original languageEnglish
Pages (from-to)424-434
Number of pages11
JournalPhysica C: Superconductivity and its applications
Volume212
Issue number3-4
DOIs
Publication statusPublished - Jul 15 1993

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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