Abstract
The expression for the thermal-fluctuation-induced depinning line, T = TP (Be), is derived theoretically for weakly pinning high-Tc superconductors. In the derivation, it is shown that the thermal displacement of pinned fluxoids, uth reduces the critical current density as Jc = Jc0 ( - 〈u2th〉/d2p) 3 2, where Jc0 is the critical current density in the absence of uth and dp is the effective half width of the summed-up pinning potential. Then Tp (itBe) is determined as the temperature at which Jc becomes zero due to the increase of 〈u2th〉 with the increase of T in the external flux density of Be. The relation of Tp(Be) with the irreversibility line of Ti(Be) and the flux melting line of Tm(Be) is also discussed.
Original language | English |
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Pages (from-to) | 424-434 |
Number of pages | 11 |
Journal | Physica C: Superconductivity and its applications |
Volume | 212 |
Issue number | 3-4 |
DOIs | |
Publication status | Published - Jul 15 1993 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering