A variation-aware low-power coding methodology for tightly coupled buses

Masanori Muroyama, Kosuke Tarumi, Koji Makiyama, Hiroto Yasuura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper describes a novel low-power coding methodology for buses. Ultra deep submicron technology and system-on-chip have resulted in a considerable portion of power consumption on buses, in which the major sources of the power consumption are the transition activities on the signal lines and the coupling capacitances of the lines. In addition, we enter an era of considering variation of the effective coupling capacitances. We address power reduction including these phenomena by using variable length coding. Experimental results show the effectiveness of our methodology.

Original languageEnglish
Title of host publicationProceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages557-560
Number of pages4
ISBN (Print)0780387368, 9780780387362
DOIs
Publication statusPublished - 2005
Event2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005 - Shanghai, China
Duration: Jan 18 2005Jan 21 2005

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Volume1

Other

Other2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
CountryChina
CityShanghai
Period1/18/051/21/05

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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  • Cite this

    Muroyama, M., Tarumi, K., Makiyama, K., & Yasuura, H. (2005). A variation-aware low-power coding methodology for tightly coupled buses. In Proceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005 (pp. 557-560). [1466226] (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC; Vol. 1). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1145/1120725.1120961