Advanced form of ζ-factor method in analytical electron microscopy

Takeshi Fujita, Masashi Watanabe, Zenji Horita, Minoru Nemoto

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

This study describes development of the ζ-factor method proposed earlier. The development is attempted by incorporating the absorption correction term into the equation relating the mass thickness to the characteristic X-ray intensity. It is shown that the advanced form of the ζ-factor method reduces restriction encountered by the earlier form and thus enhances applicability of the ζ-factor method. The advanced form is applied to the Ni-Al binary system and the Ti-Al-Cr ternary system. This application demonstrates the validity of the advanced form of the ζ-factor method. The relation between the ζ factor and the k factor is discussed and an advantage of using the ζ-factor method is summarized.

Original languageEnglish
Pages (from-to)561-568
Number of pages8
JournalJournal of Electron Microscopy
Volume48
Issue number5
DOIs
Publication statusPublished - Jan 1 1999

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Ternary systems
Electron microscopy
electron microscopy
Electron Microscopy
X rays
ternary systems
X-Rays
constrictions
x rays

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Advanced form of ζ-factor method in analytical electron microscopy. / Fujita, Takeshi; Watanabe, Masashi; Horita, Zenji; Nemoto, Minoru.

In: Journal of Electron Microscopy, Vol. 48, No. 5, 01.01.1999, p. 561-568.

Research output: Contribution to journalArticle

Fujita, Takeshi ; Watanabe, Masashi ; Horita, Zenji ; Nemoto, Minoru. / Advanced form of ζ-factor method in analytical electron microscopy. In: Journal of Electron Microscopy. 1999 ; Vol. 48, No. 5. pp. 561-568.
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