Advanced transmission electron microscopy on silver-based conductive adhesive

Naoyuki Kawamoto, Yasukazu Murakami, Daisuke Shindo, Keunsoo Kim, Katsuaki Suganuma

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Microstructure of a recently developed silver-based conductive adhesive, which is expected as a substitute for conventional soldering, has been studied by advanced transmission electron microscopy (TEM). Energy-filtered TEM has revealed the feature of dispersion of silver particles. Conductivity between neighbored particles is evaluated inside the electron microscope by using two microprobes that can be operated independently. The results shed light on the development of the silver-based conductive adhesive.

Original languageEnglish
Pages (from-to)384-388
Number of pages5
JournalNippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals
Volume70
Issue number4
DOIs
Publication statusPublished - Apr 1 2006
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Mechanics of Materials
  • Metals and Alloys
  • Materials Chemistry

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