SIS (Superconductor/Insulator/Superconductor) structures consisting of high-Tc YBa2Cu3Ox (YBCO) require epitaxial interfaces. To devise these interfaces, we have fabricated the SIS structure using NdGaO3 lattice-matched with YBCO as a substrate and an insulating layer. SIS structures were examined by Reflection High Energy Electron Diffraction (RHEED), X-ray Reflection Diffractometry (XRD) and Scanning Electron Microscopy (SEM). Results show that all epitaxial SIS structures were successfully fabricated.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering