All high-Tc epitaxial YBa2Cu3Ox / NdGaO3 / YBa2Cu3Ox heterostructures

J. Kobayashi, Y. Tazoh, M. Mukaida, S. Miyazawa

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

SIS (Superconductor/Insulator/Superconductor) structures consisting of high-Tc YBa2Cu3Ox (YBCO) require epitaxial interfaces. To devise these interfaces, we have fabricated the SIS structure using NdGaO3 lattice-matched with YBCO as a substrate and an insulating layer. SIS structures were examined by Reflection High Energy Electron Diffraction (RHEED), X-ray Reflection Diffractometry (XRD) and Scanning Electron Microscopy (SEM). Results show that all epitaxial SIS structures were successfully fabricated.

Original languageEnglish
Pages (from-to)2039-2040
Number of pages2
JournalPhysica C: Superconductivity and its applications
Volume185-189
Issue numberPART 3
DOIs
Publication statusPublished - Dec 1 1991
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'All high-Tc epitaxial YBa<sub>2</sub>Cu<sub>3</sub>O<sub>x</sub> / NdGaO<sub>3</sub> / YBa<sub>2</sub>Cu<sub>3</sub>O<sub>x</sub> heterostructures'. Together they form a unique fingerprint.

  • Cite this