Abstract
SIS (Superconductor/Insulator/Superconductor) structures consisting of high-Tc YBa2Cu3Ox (YBCO) require epitaxial interfaces. To devise these interfaces, we have fabricated the SIS structure using NdGaO3 lattice-matched with YBCO as a substrate and an insulating layer. SIS structures were examined by Reflection High Energy Electron Diffraction (RHEED), X-ray Reflection Diffractometry (XRD) and Scanning Electron Microscopy (SEM). Results show that all epitaxial SIS structures were successfully fabricated.
| Original language | English |
|---|---|
| Pages (from-to) | 2039-2040 |
| Number of pages | 2 |
| Journal | Physica C: Superconductivity and its applications |
| Volume | 185-189 |
| Issue number | PART 3 |
| DOIs | |
| Publication status | Published - Dec 1 1991 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering
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Kobayashi, J., Tazoh, Y., Mukaida, M., & Miyazawa, S. (1991). All high-Tc epitaxial YBa2Cu3Ox / NdGaO3 / YBa2Cu3Ox heterostructures. Physica C: Superconductivity and its applications, 185-189(PART 3), 2039-2040. https://doi.org/10.1016/0921-4534(91)91144-S