An accurate characterization of interface-state by deep-level transient spectroscopy for Ge metal-insulator-semiconductor capacitors with SiO 2/GeO 2 bilayer passivation

Dong Wang, Shuta Kojima, Keita Sakamoto, Keisuke Yamamoto, Hiroshi Nakashima

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)

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Physics & Astronomy