An application of the differential X-ray absorption method to thickness measurement in precipitate-containing Ni3(Al, Ti) and tial compounds

W. H. Tian, Z. Horita, T. Sano, M. Nemoto

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    1 Citation (Scopus)

    Abstract

    The differential X-ray absorption (DXA) method is applied to the thickness measurement of the two types of intermetallic compound, Ni3(Al, Ti) and TiAl, containing finely dispersed precipitate particles. It is shown that the DXA method is applicable even in the presence of particles with coherent strain fields where it is not possible to use the convergent-beam electron diffraction method. It is proposed that the absorption-free intensity ratio required for the DXA method can be determined using the extrapolation method without knowledge of specimen compositions.

    Original languageEnglish
    Pages (from-to)811-822
    Number of pages12
    JournalPhilosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties
    Volume67
    Issue number6
    DOIs
    Publication statusPublished - Jun 1993

    All Science Journal Classification (ASJC) codes

    • Chemical Engineering(all)
    • Physics and Astronomy(all)

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