TY - JOUR
T1 - An application of the differential X-ray absorption method to thickness measurement in precipitate-containing Ni3(Al, Ti) and tial compounds
AU - Tian, W. H.
AU - Horita, Z.
AU - Sano, T.
AU - Nemoto, M.
PY - 1993/6
Y1 - 1993/6
N2 - The differential X-ray absorption (DXA) method is applied to the thickness measurement of the two types of intermetallic compound, Ni3(Al, Ti) and TiAl, containing finely dispersed precipitate particles. It is shown that the DXA method is applicable even in the presence of particles with coherent strain fields where it is not possible to use the convergent-beam electron diffraction method. It is proposed that the absorption-free intensity ratio required for the DXA method can be determined using the extrapolation method without knowledge of specimen compositions.
AB - The differential X-ray absorption (DXA) method is applied to the thickness measurement of the two types of intermetallic compound, Ni3(Al, Ti) and TiAl, containing finely dispersed precipitate particles. It is shown that the DXA method is applicable even in the presence of particles with coherent strain fields where it is not possible to use the convergent-beam electron diffraction method. It is proposed that the absorption-free intensity ratio required for the DXA method can be determined using the extrapolation method without knowledge of specimen compositions.
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U2 - 10.1080/13642819308219327
DO - 10.1080/13642819308219327
M3 - Article
AN - SCOPUS:70350490693
VL - 67
SP - 811
EP - 822
JO - Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties
JF - Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties
SN - 1364-2812
IS - 6
ER -