An attempt to measure simultaneously molecular orientation and current-voltage characteristics in thin films

Takeshi Komino, Hiroyuki Tajima, Masaki Matsuda

    Research output: Contribution to journalArticlepeer-review

    4 Citations (Scopus)

    Abstract

    To investigate the relationship between molecular orientation and current voltage (J-V) characteristics, molecular orientation and J-V characteristics have been simultaneously measured in some indium tin oxide (ITO)/X/Al structures. X were thin films fabricated from poly(3-hexylthiophene) (P3HT), coumarin6 dispersed in poly(N-vinylcarvazole), or biomolecular hemin (Hm). The results have shown that the orientation change of the P3HT chain causes a reproducible loop of the J-V characteristics in P3HT thin film, and that the peak observed in the J-V characteristics in Hm is associated with irreversible molecular orientation change.

    Original languageEnglish
    Pages (from-to)1358-1361
    Number of pages4
    JournalThin Solid Films
    Volume517
    Issue number4
    DOIs
    Publication statusPublished - Dec 31 2008

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films
    • Metals and Alloys
    • Materials Chemistry

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