An investigation of grain boundaries in submicrometer-grained Al-Mg solid solution alloys using high-resolution electron microscopy

Zenji Horita, David J. Smith, Minoru Furukawa, Minoru Nemoto, Ruslan Z. Valiev, Terence G. Langdon

Research output: Contribution to journalArticle

309 Citations (Scopus)

Abstract

High-resolution electron microscopy was used to examine the structural features of grain boundaries in Al-1.5% Mg and Al-3% Mg solid solution alloys produced with submicrometer grain sizes using an intense plastic straining technique. The grain boundaries were mostly curved or wavy along their length, and some portions were corrugated with regular or irregular arrangements of facets and steps. During exposure to high-energy electrons, grain boundary migration occurred to reduce the number of facets and thus to reduce the total boundary energy. The observed features demonstrate conclusively that the grain boundaries in these submicrometer-grained materials are in a high-energy nonequilibrium configuration.

Original languageEnglish
Pages (from-to)1880-1890
Number of pages11
JournalJournal of Materials Research
Volume11
Issue number8
DOIs
Publication statusPublished - Jan 1 1996

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High resolution electron microscopy
Solid solutions
electron microscopy
Grain boundaries
solid solutions
grain boundaries
high resolution
flat surfaces
high energy electrons
plastics
grain size
Plastics
energy
Electrons
configurations

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

An investigation of grain boundaries in submicrometer-grained Al-Mg solid solution alloys using high-resolution electron microscopy. / Horita, Zenji; Smith, David J.; Furukawa, Minoru; Nemoto, Minoru; Valiev, Ruslan Z.; Langdon, Terence G.

In: Journal of Materials Research, Vol. 11, No. 8, 01.01.1996, p. 1880-1890.

Research output: Contribution to journalArticle

Horita, Zenji ; Smith, David J. ; Furukawa, Minoru ; Nemoto, Minoru ; Valiev, Ruslan Z. ; Langdon, Terence G. / An investigation of grain boundaries in submicrometer-grained Al-Mg solid solution alloys using high-resolution electron microscopy. In: Journal of Materials Research. 1996 ; Vol. 11, No. 8. pp. 1880-1890.
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