TY - GEN
T1 - An Overview of GaN-Based Monolithic Power Integrated Circuit Technology on Polarization-Junction Platform
AU - Nakajima, Akira
AU - Nishizawa, Sin Ichi
AU - Kubota, Shunsuke
AU - Kayanuma, Rei
AU - Tsutsui, Kazuo
AU - Ohashi, Hiromichi
AU - Kakushima, Kuniyuki
AU - Wakabayashi, Hitoshi
AU - Iwai, Hiroshi
PY - 2015/10/30
Y1 - 2015/10/30
N2 - This paper gives an overview of GaN-based polarization-junction (PJ) technologies. PJ platform wafers have both high-density 2D hole gas (2DHG) and 2D electron gas (2DEG) respectively induced by negative and positive polarization charges in undoped GaN/AlGaN/GaN double heterostructures. On the platform, monolithic operations of GaN-based n-channel transistors and p-channel transistors have been demonstrated. Because of temperature independent properties of the 2DHG and 2DEG, the GaN devices can operate in wide temperature range. In addition, high voltage transistors and diode are also available on the platform by using polarization-superjunction concept.
AB - This paper gives an overview of GaN-based polarization-junction (PJ) technologies. PJ platform wafers have both high-density 2D hole gas (2DHG) and 2D electron gas (2DEG) respectively induced by negative and positive polarization charges in undoped GaN/AlGaN/GaN double heterostructures. On the platform, monolithic operations of GaN-based n-channel transistors and p-channel transistors have been demonstrated. Because of temperature independent properties of the 2DHG and 2DEG, the GaN devices can operate in wide temperature range. In addition, high voltage transistors and diode are also available on the platform by using polarization-superjunction concept.
UR - http://www.scopus.com/inward/record.url?scp=84962222561&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84962222561&partnerID=8YFLogxK
U2 - 10.1109/CSICS.2015.7314489
DO - 10.1109/CSICS.2015.7314489
M3 - Conference contribution
AN - SCOPUS:84962222561
T3 - 2015 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2015
BT - 2015 IEEE Compound Semiconductor Integrated Circuit Symposium, CSICS 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 37th IEEE International Symposium on Workload Characterization, IISWC 2015
Y2 - 11 October 2015 through 14 October 2015
ER -