Analysis and minimization of test time in a combined BIST and external test approach

Makoto Sugihara, Hiroshi Date, Hiroto Yasuura

Research output: Contribution to journalConference article

37 Citations (Scopus)

Abstract

In this paper, an, analysis of test time by CBET (which is an acronym for Combination of BIST and External Test) test approach is presented. The analysis validates that CBET test approach can achieve shorter testing time than both external test and BIST in many situations. An efficient test time minimization algorithm for CBET-based LSIs is also proposed. It uses several characteristics of CBET test approach derived by the analysis to reduce computation time to find the optimum test sets. The algorithm helps designers to save their precious design time.

Original languageEnglish
Article number840029
Pages (from-to)134-140
Number of pages7
JournalProceedings -Design, Automation and Test in Europe, DATE
DOIs
Publication statusPublished - Dec 1 2000
EventDesign, Automation and Test in Europe Conference and Exhibition 2000, DATE 2000 - Paris, France
Duration: Mar 27 2000Mar 30 2000

Fingerprint

Built-in self test
Testing

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Analysis and minimization of test time in a combined BIST and external test approach. / Sugihara, Makoto; Date, Hiroshi; Yasuura, Hiroto.

In: Proceedings -Design, Automation and Test in Europe, DATE, 01.12.2000, p. 134-140.

Research output: Contribution to journalConference article

@article{df3d99015ace49b4876faf79c3ebf26e,
title = "Analysis and minimization of test time in a combined BIST and external test approach",
abstract = "In this paper, an, analysis of test time by CBET (which is an acronym for Combination of BIST and External Test) test approach is presented. The analysis validates that CBET test approach can achieve shorter testing time than both external test and BIST in many situations. An efficient test time minimization algorithm for CBET-based LSIs is also proposed. It uses several characteristics of CBET test approach derived by the analysis to reduce computation time to find the optimum test sets. The algorithm helps designers to save their precious design time.",
author = "Makoto Sugihara and Hiroshi Date and Hiroto Yasuura",
year = "2000",
month = "12",
day = "1",
doi = "10.1109/DATE.2000.840029",
language = "English",
pages = "134--140",
journal = "Proceedings -Design, Automation and Test in Europe, DATE",
issn = "1530-1591",

}

TY - JOUR

T1 - Analysis and minimization of test time in a combined BIST and external test approach

AU - Sugihara, Makoto

AU - Date, Hiroshi

AU - Yasuura, Hiroto

PY - 2000/12/1

Y1 - 2000/12/1

N2 - In this paper, an, analysis of test time by CBET (which is an acronym for Combination of BIST and External Test) test approach is presented. The analysis validates that CBET test approach can achieve shorter testing time than both external test and BIST in many situations. An efficient test time minimization algorithm for CBET-based LSIs is also proposed. It uses several characteristics of CBET test approach derived by the analysis to reduce computation time to find the optimum test sets. The algorithm helps designers to save their precious design time.

AB - In this paper, an, analysis of test time by CBET (which is an acronym for Combination of BIST and External Test) test approach is presented. The analysis validates that CBET test approach can achieve shorter testing time than both external test and BIST in many situations. An efficient test time minimization algorithm for CBET-based LSIs is also proposed. It uses several characteristics of CBET test approach derived by the analysis to reduce computation time to find the optimum test sets. The algorithm helps designers to save their precious design time.

UR - http://www.scopus.com/inward/record.url?scp=84893689452&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84893689452&partnerID=8YFLogxK

U2 - 10.1109/DATE.2000.840029

DO - 10.1109/DATE.2000.840029

M3 - Conference article

SP - 134

EP - 140

JO - Proceedings -Design, Automation and Test in Europe, DATE

JF - Proceedings -Design, Automation and Test in Europe, DATE

SN - 1530-1591

M1 - 840029

ER -