Analysis and minimization of test time in a combined BIST and external test approach

Makoto Sugihara, Hiroshi Date, Hiroto Yasuura

Research output: Contribution to journalConference article

37 Citations (Scopus)

Abstract

In this paper, an, analysis of test time by CBET (which is an acronym for Combination of BIST and External Test) test approach is presented. The analysis validates that CBET test approach can achieve shorter testing time than both external test and BIST in many situations. An efficient test time minimization algorithm for CBET-based LSIs is also proposed. It uses several characteristics of CBET test approach derived by the analysis to reduce computation time to find the optimum test sets. The algorithm helps designers to save their precious design time.

Original languageEnglish
Article number840029
Pages (from-to)134-140
Number of pages7
JournalProceedings -Design, Automation and Test in Europe, DATE
DOIs
Publication statusPublished - 2000
EventDesign, Automation and Test in Europe Conference and Exhibition 2000, DATE 2000 - Paris, France
Duration: Mar 27 2000Mar 30 2000

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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