Analysis of error due to exclusion of higher modes on complex permittivity measurement using waveguide with flange

Kouji Shibata, Osamu Hashimoto, Ramesh Pokharel

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

In this letter, we discuss the measurement error due to the exclusion of the higher modes when a waveguide with a flange is inserted with lossy dielectric material. The reflection coefficient is calculated by a spectrum-domain approach (SDA). which uses only the dominant (TE10) mode to realize a simplified nondestructive measurement of complex permittivity of lossy dielectric sheets. The analysis shows that the error due to the exclusion of the higher modes decreases as complex permittivity increases. Consequently, we have confirmed that a simplified measurement of complex permittivity is possible by a coverage limitation with the SDA, which excludes the higher modes.

Original languageEnglish
Pages (from-to)139-142
Number of pages4
JournalIEICE Transactions on Electronics
VolumeE88-C
Issue number1
DOIs
Publication statusPublished - Jan 1 2005
Externally publishedYes

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Permittivity measurement
Flanges
Waveguides
Permittivity
Measurement errors

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Analysis of error due to exclusion of higher modes on complex permittivity measurement using waveguide with flange. / Shibata, Kouji; Hashimoto, Osamu; Pokharel, Ramesh.

In: IEICE Transactions on Electronics, Vol. E88-C, No. 1, 01.01.2005, p. 139-142.

Research output: Contribution to journalArticle

@article{589226e473ae480ba33b0288ca3723b7,
title = "Analysis of error due to exclusion of higher modes on complex permittivity measurement using waveguide with flange",
abstract = "In this letter, we discuss the measurement error due to the exclusion of the higher modes when a waveguide with a flange is inserted with lossy dielectric material. The reflection coefficient is calculated by a spectrum-domain approach (SDA). which uses only the dominant (TE10) mode to realize a simplified nondestructive measurement of complex permittivity of lossy dielectric sheets. The analysis shows that the error due to the exclusion of the higher modes decreases as complex permittivity increases. Consequently, we have confirmed that a simplified measurement of complex permittivity is possible by a coverage limitation with the SDA, which excludes the higher modes.",
author = "Kouji Shibata and Osamu Hashimoto and Ramesh Pokharel",
year = "2005",
month = "1",
day = "1",
doi = "10.1093/ietele/E88-C.1.139",
language = "English",
volume = "E88-C",
pages = "139--142",
journal = "IEICE Transactions on Electronics",
issn = "0916-8524",
publisher = "The Institute of Electronics, Information and Communication Engineers (IEICE)",
number = "1",

}

TY - JOUR

T1 - Analysis of error due to exclusion of higher modes on complex permittivity measurement using waveguide with flange

AU - Shibata, Kouji

AU - Hashimoto, Osamu

AU - Pokharel, Ramesh

PY - 2005/1/1

Y1 - 2005/1/1

N2 - In this letter, we discuss the measurement error due to the exclusion of the higher modes when a waveguide with a flange is inserted with lossy dielectric material. The reflection coefficient is calculated by a spectrum-domain approach (SDA). which uses only the dominant (TE10) mode to realize a simplified nondestructive measurement of complex permittivity of lossy dielectric sheets. The analysis shows that the error due to the exclusion of the higher modes decreases as complex permittivity increases. Consequently, we have confirmed that a simplified measurement of complex permittivity is possible by a coverage limitation with the SDA, which excludes the higher modes.

AB - In this letter, we discuss the measurement error due to the exclusion of the higher modes when a waveguide with a flange is inserted with lossy dielectric material. The reflection coefficient is calculated by a spectrum-domain approach (SDA). which uses only the dominant (TE10) mode to realize a simplified nondestructive measurement of complex permittivity of lossy dielectric sheets. The analysis shows that the error due to the exclusion of the higher modes decreases as complex permittivity increases. Consequently, we have confirmed that a simplified measurement of complex permittivity is possible by a coverage limitation with the SDA, which excludes the higher modes.

UR - http://www.scopus.com/inward/record.url?scp=27544496083&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=27544496083&partnerID=8YFLogxK

U2 - 10.1093/ietele/E88-C.1.139

DO - 10.1093/ietele/E88-C.1.139

M3 - Article

AN - SCOPUS:27544496083

VL - E88-C

SP - 139

EP - 142

JO - IEICE Transactions on Electronics

JF - IEICE Transactions on Electronics

SN - 0916-8524

IS - 1

ER -