Analysis of high mobility oxide thin-film transistors after a low temperature annealing process

Juan Paolo Bermundo, Yasuaki Ishikawa, Mami N. Fujii, Chaiyanan Kulchaisit, Hiroshi Ikenoue, Yukiharu Uraoka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint Dive into the research topics of 'Analysis of high mobility oxide thin-film transistors after a low temperature annealing process'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science