Analysis of molecular aggregation states in pentacene thin films prepared from soluble precursor

Takahiro Akinaga; Shigekazu Yasutake; Sono Sasaki; Osami Sakata; Hideyuki Otsuka; Atsushi Takahara

doi:10.1246/cl.2006.1162

Analysis of molecular aggregation states in pentacene thin films prepared from soluble precursor

Takahiro Akinaga, Shigekazu Yasutake, Sono Sasaki, Osami Sakata, Hideyuki Otsuka, Atsushi Takahara

Department of Applied Molecular Chemistry

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

Molecular packing structure in pentacene films prepared from the Afzali's precursor soluble in general organic solvents was characterized by in-plane grazing-incidence X-ray diffraction (GIXD) measurements. The crystallographic ab plane of pentacene was parallel to the surface of a Si substrate. Crystal structure of pentacene near the substrate was identified as the thin-film phase.

Original language	English
Pages (from-to)	1162-1163
Number of pages	2
Journal	Chemistry Letters
Volume	35
Issue number	10
DOIs	https://doi.org/10.1246/cl.2006.1162
Publication status	Published - Oct 5 2006

All Science Journal Classification (ASJC) codes

Chemistry(all)

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10.1246/cl.2006.1162

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abstract = "Molecular packing structure in pentacene films prepared from the Afzali's precursor soluble in general organic solvents was characterized by in-plane grazing-incidence X-ray diffraction (GIXD) measurements. The crystallographic ab plane of pentacene was parallel to the surface of a Si substrate. Crystal structure of pentacene near the substrate was identified as the thin-film phase.",

author = "Takahiro Akinaga and Shigekazu Yasutake and Sono Sasaki and Osami Sakata and Hideyuki Otsuka and Atsushi Takahara",

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AU - Akinaga, Takahiro

AU - Yasutake, Shigekazu

AU - Sasaki, Sono

AU - Sakata, Osami

AU - Otsuka, Hideyuki

AU - Takahara, Atsushi

PY - 2006/10/5

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AB - Molecular packing structure in pentacene films prepared from the Afzali's precursor soluble in general organic solvents was characterized by in-plane grazing-incidence X-ray diffraction (GIXD) measurements. The crystallographic ab plane of pentacene was parallel to the surface of a Si substrate. Crystal structure of pentacene near the substrate was identified as the thin-film phase.

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