Analysis of surface composition of isotopic polymer blend based on time-of-flight secondary ion mass spectroscopy

Atsushi Takahara, Daisuke Kawaguchi, Keiji Tanaka, M. Tozu, T. Hoshi, T. Kajiyama

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Surface chemical composition of blend composed of monodisperse polystyrene (hPS) with the number-average molecular weight, M n , of 19.7 k and deuterated monodisperse polystyrene (dPS) with M n of 847 k was analyzed based on time-of-flight secondary ion mass spectroscopy (ToF-SIMS). Although hPS possess higher surface free energy than dPS, ToF-SIMS revealed that hPS was preferentially segregated at the outermost surface of the blend films with various compositions. The surface segregation of hPS can be explained in terms of the molecular weight disparity for both components, i.e., an entropic effect.

Original languageEnglish
Pages (from-to)538-540
Number of pages3
JournalApplied Surface Science
Volume203-204
DOIs
Publication statusPublished - Jan 15 2003

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Polystyrenes
Polymer blends
Surface structure
Spectroscopy
Ions
Molecular weight
Surface segregation
Chemical analysis
Free energy

All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films

Cite this

Analysis of surface composition of isotopic polymer blend based on time-of-flight secondary ion mass spectroscopy. / Takahara, Atsushi; Kawaguchi, Daisuke; Tanaka, Keiji; Tozu, M.; Hoshi, T.; Kajiyama, T.

In: Applied Surface Science, Vol. 203-204, 15.01.2003, p. 538-540.

Research output: Contribution to journalArticle

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