Analysis of surface composition of isotopic polymer blend based on time-of-flight secondary ion mass spectroscopy

A. Takahara; D. Kawaguchi; K. Tanaka; M. Tozu; T. Hoshi; T. Kajiyama

doi:10.1016/S0169-4332(02)00748-1

Analysis of surface composition of isotopic polymer blend based on time-of-flight secondary ion mass spectroscopy

A. Takahara, D. Kawaguchi, K. Tanaka, M. Tozu, T. Hoshi, T. Kajiyama

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

Abstract

Surface chemical composition of blend composed of monodisperse polystyrene (hPS) with the number-average molecular weight, M _n , of 19.7 k and deuterated monodisperse polystyrene (dPS) with M _n of 847 k was analyzed based on time-of-flight secondary ion mass spectroscopy (ToF-SIMS). Although hPS possess higher surface free energy than dPS, ToF-SIMS revealed that hPS was preferentially segregated at the outermost surface of the blend films with various compositions. The surface segregation of hPS can be explained in terms of the molecular weight disparity for both components, i.e., an entropic effect.

Original language	English
Pages (from-to)	538-540
Number of pages	3
Journal	Applied Surface Science
Volume	203-204
DOIs	https://doi.org/10.1016/S0169-4332(02)00748-1
Publication status	Published - Jan 15 2003

All Science Journal Classification (ASJC) codes

Chemistry(all)
Condensed Matter Physics
Physics and Astronomy(all)
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1016/S0169-4332(02)00748-1

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title = "Analysis of surface composition of isotopic polymer blend based on time-of-flight secondary ion mass spectroscopy",

abstract = " Surface chemical composition of blend composed of monodisperse polystyrene (hPS) with the number-average molecular weight, M n , of 19.7 k and deuterated monodisperse polystyrene (dPS) with M n of 847 k was analyzed based on time-of-flight secondary ion mass spectroscopy (ToF-SIMS). Although hPS possess higher surface free energy than dPS, ToF-SIMS revealed that hPS was preferentially segregated at the outermost surface of the blend films with various compositions. The surface segregation of hPS can be explained in terms of the molecular weight disparity for both components, i.e., an entropic effect.",

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T1 - Analysis of surface composition of isotopic polymer blend based on time-of-flight secondary ion mass spectroscopy

AU - Takahara, A.

AU - Kawaguchi, D.

AU - Tanaka, K.

AU - Tozu, M.

AU - Hoshi, T.

AU - Kajiyama, T.

PY - 2003/1/15

Y1 - 2003/1/15

N2 - Surface chemical composition of blend composed of monodisperse polystyrene (hPS) with the number-average molecular weight, M n , of 19.7 k and deuterated monodisperse polystyrene (dPS) with M n of 847 k was analyzed based on time-of-flight secondary ion mass spectroscopy (ToF-SIMS). Although hPS possess higher surface free energy than dPS, ToF-SIMS revealed that hPS was preferentially segregated at the outermost surface of the blend films with various compositions. The surface segregation of hPS can be explained in terms of the molecular weight disparity for both components, i.e., an entropic effect.

AB - Surface chemical composition of blend composed of monodisperse polystyrene (hPS) with the number-average molecular weight, M n , of 19.7 k and deuterated monodisperse polystyrene (dPS) with M n of 847 k was analyzed based on time-of-flight secondary ion mass spectroscopy (ToF-SIMS). Although hPS possess higher surface free energy than dPS, ToF-SIMS revealed that hPS was preferentially segregated at the outermost surface of the blend films with various compositions. The surface segregation of hPS can be explained in terms of the molecular weight disparity for both components, i.e., an entropic effect.

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DO - 10.1016/S0169-4332(02)00748-1

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SN - 0169-4332

VL - 203-204

SP - 538

EP - 540

JO - Applied Surface Science

JF - Applied Surface Science

ER -

Analysis of surface composition of isotopic polymer blend based on time-of-flight secondary ion mass spectroscopy

Abstract

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