Analysis of trace element in solids by using laser ablation atomic fluorescence spectroscopy

M. K. Kim, H. Ishii, T. Takao, Yuji Oki, M. Maeda

Research output: Contribution to journalArticlepeer-review

Abstract

The availability of laser ablation atomic fluorescence (LAAF) spectroscopy for the nano-meter scale analysis of the sample surface was demonstrated. With the use of polymer samples of the Na-doped polymethyl methacrylate (PMMA), a limit of detection in the trace element analysis of Na was acquired as 36 fg. In addition, the LAAF technique was also applied for the trace element analysis of phosphorus contained in the n-type Si.

Original languageEnglish
Pages (from-to)512-513
Number of pages2
JournalUnknown Journal
Publication statusPublished - 2000

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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