Analysis of wear-out degradation of a DFB laser using an optical-beam-induced current monitor

Tatsuya Takeshita, Mitsuo Yamamoto, Ryuzo Iga, Mitsuru Sugo, Yasuhiro Kondo, Kazutoshi Kato

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

We investigated the degradation behavior of distributed feedback lasers by employing the optical-beam-induced current measurement technique. We showed that the degradation mechanism is governed by diffused defects at the waveguide other than those in the vicinity of the antireflection facet. In addition, we found that a diffused source is probably generated in the upper InP cladding layer above the grating during the growth of the upper InP cladding layer.

Original languageEnglish
Pages (from-to)1852-1859
Number of pages8
JournalIEEE Transactions on Electron Devices
Volume54
Issue number8
DOIs
Publication statusPublished - Aug 1 2007
Externally publishedYes

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Distributed feedback lasers
Induced currents
Wear of materials
Degradation
Electric current measurement
Waveguides
Defects

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Analysis of wear-out degradation of a DFB laser using an optical-beam-induced current monitor. / Takeshita, Tatsuya; Yamamoto, Mitsuo; Iga, Ryuzo; Sugo, Mitsuru; Kondo, Yasuhiro; Kato, Kazutoshi.

In: IEEE Transactions on Electron Devices, Vol. 54, No. 8, 01.08.2007, p. 1852-1859.

Research output: Contribution to journalArticle

Takeshita, Tatsuya ; Yamamoto, Mitsuo ; Iga, Ryuzo ; Sugo, Mitsuru ; Kondo, Yasuhiro ; Kato, Kazutoshi. / Analysis of wear-out degradation of a DFB laser using an optical-beam-induced current monitor. In: IEEE Transactions on Electron Devices. 2007 ; Vol. 54, No. 8. pp. 1852-1859.
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