Analysis of wear-out degradation of a DFB laser using an optical-beam-induced current monitor

Tatsuya Takeshita; Mitsuo Yamamoto; Ryuzo Iga; Mitsuru Sugo; Yasuhiro Kondo; Kazutoshi Kato

doi:10.1109/TED.2007.900975

Analysis of wear-out degradation of a DFB laser using an optical-beam-induced current monitor

Tatsuya Takeshita, Mitsuo Yamamoto, Ryuzo Iga, Mitsuru Sugo, Yasuhiro Kondo, Kazutoshi Kato

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

We investigated the degradation behavior of distributed feedback lasers by employing the optical-beam-induced current measurement technique. We showed that the degradation mechanism is governed by diffused defects at the waveguide other than those in the vicinity of the antireflection facet. In addition, we found that a diffused source is probably generated in the upper InP cladding layer above the grating during the growth of the upper InP cladding layer.

Original language	English
Pages (from-to)	1852-1859
Number of pages	8
Journal	IEEE Transactions on Electron Devices
Volume	54
Issue number	8
DOIs	https://doi.org/10.1109/TED.2007.900975
Publication status	Published - Aug 1 2007
Externally published	Yes

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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10.1109/TED.2007.900975

Cite this

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AU - Yamamoto, Mitsuo

AU - Iga, Ryuzo

AU - Sugo, Mitsuru

AU - Kondo, Yasuhiro

AU - Kato, Kazutoshi

PY - 2007/8/1

Y1 - 2007/8/1

N2 - We investigated the degradation behavior of distributed feedback lasers by employing the optical-beam-induced current measurement technique. We showed that the degradation mechanism is governed by diffused defects at the waveguide other than those in the vicinity of the antireflection facet. In addition, we found that a diffused source is probably generated in the upper InP cladding layer above the grating during the growth of the upper InP cladding layer.

AB - We investigated the degradation behavior of distributed feedback lasers by employing the optical-beam-induced current measurement technique. We showed that the degradation mechanism is governed by diffused defects at the waveguide other than those in the vicinity of the antireflection facet. In addition, we found that a diffused source is probably generated in the upper InP cladding layer above the grating during the growth of the upper InP cladding layer.

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Analysis of wear-out degradation of a DFB laser using an optical-beam-induced current monitor

Abstract

All Science Journal Classification (ASJC) codes

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