Analytical electron microscopy study of diffusion-bonded multiphase system

M. Watanabe, Z. Horita, M. Nemoto

    Research output: Contribution to journalArticlepeer-review

    31 Citations (Scopus)

    Abstract

    This study presents diffusion experiments of NiAl coupled with pure Ni (Ni/NiAl). The couple produces the Ni3Al-based intermetallic phase (γ' phase) as an intermediate layer at the interface during diffusion annealing. Analytical electron microscopy is used to examine microstructural features, crystallographic orientation and compositional variations across the interface. Interdiffusivities are measured from the compositional variations. It is shown that the growing behavior of the γ' phase changes between higher and lower annealing temperatures. The growth kinetics of the γ' phase is also discussed.

    Original languageEnglish
    Pages (from-to)229-241
    Number of pages13
    JournalInterface Science
    Volume4
    Issue number3-4
    DOIs
    Publication statusPublished - Sep 1997

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Materials Science(all)
    • Condensed Matter Physics

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