Analytical investigation of grain boundaries of compressive deformed Al-doped sintered β-SiC

Kenji Kaneko, Sawao Honda, Takayuki Nagano, Tomohiro Saitoh

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Series of analytical investigations were carried out to study the effect of deformation process at grain boundaries of Al-doped β-SiC (β-SiC[Al]). Three specimens, as-sintered, annealed and compressed β-SiC[Al] specimens were provided. Grain boundaries were observed by a high-resolution transmission electron microscope (HRTEM) and analytically investigated by energy dispersive X-ray spectroscopy (EDS) also electron energy loss spectroscopy (EELS) attached on a scanning transmission electron microscope (STEM). Glass phases Al-Si-O were commonly observed from the grain boundaries of the as-sintered specimen. It was also analyzed by EELS measurements that the amorphous phases were occasionally modified to form the fourfold coordinated aluminum-oxide by the compressive deformation. On the other hand, there were little traces of Al and O atoms observed from annealed specimen which suggests the vaporization of amorphous glass phase from the grain boundaries, due to the elevated temperature.

Original languageEnglish
Pages (from-to)136-143
Number of pages8
JournalMaterials Science and Engineering A
Volume285
Issue number1-2
Publication statusPublished - Jun 15 2000

Fingerprint

Grain boundaries
grain boundaries
Electron energy loss spectroscopy
Electron microscopes
electron microscopes
energy dissipation
electron energy
spectroscopy
Glass
Aluminum Oxide
glass
Vaporization
Energy dispersive spectroscopy
aluminum oxides
Scanning
Aluminum
Atoms
Oxides
scanning
high resolution

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Analytical investigation of grain boundaries of compressive deformed Al-doped sintered β-SiC. / Kaneko, Kenji; Honda, Sawao; Nagano, Takayuki; Saitoh, Tomohiro.

In: Materials Science and Engineering A, Vol. 285, No. 1-2, 15.06.2000, p. 136-143.

Research output: Contribution to journalArticle

Kaneko, Kenji ; Honda, Sawao ; Nagano, Takayuki ; Saitoh, Tomohiro. / Analytical investigation of grain boundaries of compressive deformed Al-doped sintered β-SiC. In: Materials Science and Engineering A. 2000 ; Vol. 285, No. 1-2. pp. 136-143.
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