Analytical study of resistance drift phenomena on (PANI) xMoO3 hybrid thin films as gas sensors

Toshio Itoh, Ichiro Matsubara, Woosuck Shin, Noriya Izu, Maiko Nishibori

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Polyaniline (PANI)-intercalated MoO3 ((PANI)xMoO 3), which is a conventional layered organic/MoO3 hybrid, as a gas sensor has a resistance drift problem, which should be solved in order to realize practical applicable gas sensing devices. In this analytical study, XPS studies reveal that the resistance drift is caused by adsorbing and desorbing oxygen molecules from the atmosphere. The adsorption of enough oxygen molecules by annealing in air at a higher temperature than operating temperature can reduce the resistance drift phenomena.

Original languageEnglish
Pages (from-to)1331-1335
Number of pages5
JournalBulletin of the Chemical Society of Japan
Volume81
Issue number10
DOIs
Publication statusPublished - Oct 15 2008

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Chemical sensors
Oxygen
Thin films
Molecules
X ray photoelectron spectroscopy
Gases
Annealing
Adsorption
Temperature
Air
molybdenum trioxide
polyaniline

All Science Journal Classification (ASJC) codes

  • Chemistry(all)

Cite this

Analytical study of resistance drift phenomena on (PANI) xMoO3 hybrid thin films as gas sensors. / Itoh, Toshio; Matsubara, Ichiro; Shin, Woosuck; Izu, Noriya; Nishibori, Maiko.

In: Bulletin of the Chemical Society of Japan, Vol. 81, No. 10, 15.10.2008, p. 1331-1335.

Research output: Contribution to journalArticle

Itoh, Toshio ; Matsubara, Ichiro ; Shin, Woosuck ; Izu, Noriya ; Nishibori, Maiko. / Analytical study of resistance drift phenomena on (PANI) xMoO3 hybrid thin films as gas sensors. In: Bulletin of the Chemical Society of Japan. 2008 ; Vol. 81, No. 10. pp. 1331-1335.
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