Analyzing the Degradation Process of Quantum-Dot LEDs (QLEDs) by Mass Spectrometryf

Hin Wai Mo, Daichi Shirakura, Kentaro Harada, Kiyoshi Ishibashi, Takahiro Shibamori, Takashi Miyamoto, Chihaya Adachi

Research output: Contribution to journalConference articlepeer-review

Abstract

By utilizing time-of-flight secondary ion mass spectrometry (TOF-SIMS), the degradation processes of quantum dot core components and the surface ligands were studied. Intentionally degraded QLED samples were prepared, and the TOF-SIMS mass composition signals of each layer within the QLEDs are estimated. The result of the analysis gives possible structural information of the degraded species induced in the device, providing useful insights for further developments of highly efficientR/G/B quantum dotmaterials.

Original languageEnglish
Pages (from-to)1-4
Number of pages4
JournalDigest of Technical Papers - SID International Symposium
Volume53
Issue number1
DOIs
Publication statusPublished - 2022
Event59th International Symposium, Seminar and Exhibition, Display Week 2022 - San Jose, United States
Duration: May 8 2022May 13 2022

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Fingerprint

Dive into the research topics of 'Analyzing the Degradation Process of Quantum-Dot LEDs (QLEDs) by Mass Spectrometryf'. Together they form a unique fingerprint.

Cite this