Angular dependency of neutron-induced multiple cell upsets in 65-nm 10T subthreshold SRAM

Ryo Harada, Shin Ichiro Abe, Hiroshi Fuketa, Taiki Uemura, Masanori Hashimoto, Yukinobu Watanabe

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)

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Engineering & Materials Science

Physics & Astronomy