Anisotropic stress-sensitive temperature dependence of the lattice constant of silicon

Y. Soejima, K. Inoue, T. Kawahara, N. Ohama, A. Okazaki

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The previous experiment of high-angle double-crystal X-ray diffraction (HADOX) performed on silicon at low temperatures showed a very anomalous behaviour of a(T), the lattice constant as a function of temperature. An extensive study has since been made under various conditions of specimen crystals. The results are in contradiction with the common belief that the silicon crystal with the diamond structure is rigid and stable: It is found that the anomaly is rather sensitive to external stresses and that the behaviour of a(T) can therefore be very complicated. It is also found that the anomaly is anisotropic, namely largest in (111) direction and smallest in (110) direction. The apparent irreproducible behaviour of a(T) is attributed to an atomic rearrangement with a long relaxation time.

Original languageEnglish
Pages (from-to)2431-2436
Number of pages6
JournalJournal of Physics C: Solid State Physics
Volume18
Issue number12
DOIs
Publication statusPublished - Apr 30 1985

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Engineering(all)
  • Physics and Astronomy(all)

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