To simulate the anisotropic thermal stress with complex crystal-melt interface evolution by the fixed-grid method during seeded growth of monocrystalline silicon, a new method that can solve the global stress field involving the crystal and melt regions without a requisite of accurate locations of the interface was proposed. The melt is regarded as a kind of hypothetical solid material that has isotropic material properties. Free boundary conditions along the crystal-melt interface are implicitly satisfied with all of the stress components inside the melt region being close to zero compared to those inside the crystal region. Therefore, regardless of the complexity of the interface shape, the stress field can be easily analyzed by a simple solver and a set of simple fixed grids even for extremely complex interface evolution. Results of numerical simulations in the isotropic, , and  growths show good consistence with other numerical and experimental results.
All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Condensed Matter Physics