Abstract
The anisotropy of elastic bulk constants of wurtzite InN is analyzed theoretically on the basis of available data for elastic constants. A considerable anisotropy is evaluated both for Young's modulus and Poisson ratio of highly textured InN epitaxial films deposited on the basal plane. A comparative analysis of elastic properties is conducted for wurtzite InN, GaN and AlN. An approach is suggested for estimating vacancy concentrations on the basis of SIMS and x-ray diffraction measurements.
| Original language | English |
|---|---|
| Pages (from-to) | 79-89 |
| Number of pages | 11 |
| Journal | Defect and Diffusion Forum |
| Volume | 226-228 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2004 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Radiation
- Materials Science(all)
- Condensed Matter Physics