Annealing effect for LaxC60 thin films

T. Terui, K. A. Williams, Y. Fujikawa, Takeshi Arai, S. Mashiko, Y. Maruyama

Research output: Contribution to journalArticle

Abstract

Numerous studies on metal-doped C60 compounds had been done since the discovery of superconducting C60 compounds. It is interesting to study physical properties of trivalent-meta-doped C60. We examined La-doped C60 thin films fabricated by layer-by-layer (LBL) deposition with a multi-source evaporation system. The physical properties of LaxC60 depend on the diffusion of La atoms in the film, so we studied the effect of annealing. The crystal structure and morphology of LaxC60 thin films were examined by X-ray diffraction and AFM and electronic structure was also examined by UPS. We found that annealing promotes orientation of the crystal. UPS spectra showed the change depends on the concentration of La atoms. Moreover, the spectrum of annealed thin film was quite different from that of as-deposited thin film.

Original languageEnglish
Pages (from-to)113-116
Number of pages4
JournalThin Solid Films
Volume331
Issue number1-2
DOIs
Publication statusPublished - Jan 1 1998

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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